Data analysis scheme for correcting general misalignments of an optics configuration for a voltage measurement system based on the Pockels electro-optic effect

2021 ◽  
Vol 92 (4) ◽  
pp. 043105
Author(s):  
Seongmin Choi ◽  
Dong-Geun Lee ◽  
H. J. Woo ◽  
S. H. Hong ◽  
Seunggi Ham ◽  
...  
Keyword(s):  
Data Analysis ◽  
Measurement System ◽  
Voltage Measurement ◽  
Electro Optic ◽  
Analysis Scheme

Polar-coordinate-based data analysis scheme for high-voltage measurement system using the Pockels electro-optic effect

2020 ◽  
Vol 15 (03) ◽  
pp. C03030-C03030
Author(s):  
S. Choi ◽  
A.A. Sugianto ◽  
D.-g. Lee ◽  
H.J. Woo ◽  
S.H. Hong ◽  
...  
Keyword(s):  
Data Analysis ◽  
High Voltage ◽  
Measurement System ◽  
Voltage Measurement ◽  
Electro Optic ◽  
Analysis Scheme ◽  
Polar Coordinate

scholarly journals Visualization of frequency-modulated electric field based on photonic frequency tracking in asynchronous electro-optic measurement system

2018 ◽  
Vol 11 (4) ◽  
pp. 046601 ◽  
Author(s):  
Shintaro Hisatake ◽  
Koki Yamaguchi ◽  
Hirohisa Uchida ◽  
Makoto Tojyo ◽  
Yoichi Oikawa ◽  
...  
Keyword(s):  
Electric Field ◽  
Measurement System ◽  
Frequency Tracking ◽  
Electro Optic

Ultrasonography applied to the description of voice quality settings in adult speakers of Brazilian Portuguese

Revista CEFAC ◽  
2021 ◽  
Vol 23 (6) ◽  
Author(s):  
Tamar Vieira de Jesus ◽  
Aline Neves Pessoa Almeida ◽  
Zuleica Camargo
Keyword(s):  
Data Analysis ◽  
Instructional Material ◽  
Profile Analysis ◽  
Voice Quality ◽  
Brazilian Portuguese ◽  
Ultrasound Images ◽  
Perceptual Judgments ◽  
Analysis Scheme ◽  
Vocal Quality

ABSTRACT Purpose: to relate ultrasound images with auditory-perceptual data on vocal quality settings in adult speakers of Brazilian Portuguese. Methods: the corpus consisted of speech samples (sentences contained in the instructional material of the Vocal Profile Analysis Scheme - VPAS-PB) from seven adult subjects of both genders, recorded simultaneously by acoustic and ultrasonographic means. Data analysis was based on auditory-perceptual judgments of vocal quality and ultrasound images generated by the AAA software. Results: vocal quality settings related to the position of the tongue body and the extension of the tongue and jaw found correspondences to the contours of ultrasound images of the tongue in selected key segments (oral vowels), especially those with greater degrees of manifestation. Conclusion: there were correspondences between vocal quality settings detected in the perceptual sphere and their respective tongue body and jaw ultrasound images.

Research of DC Current Measurement Technology Based on Optical Fiber Thermometry

2011 ◽  
Vol 128-129 ◽  
pp. 686-689 ◽  
Author(s):  
Dan Ping Jia ◽  
Yang Wang ◽  
Song Lin ◽  
Quan Kang Wei
Keyword(s):  
Thin Film ◽  
Optical Fiber ◽  
Measurement System ◽  
Low Voltage ◽  
Low Cost ◽  
Electric Heating ◽  
Measurement Technology ◽  
Voltage Measurement ◽  
Film Sensor ◽  
Dc Current

Thin film sensor has the advantages of small size and low cost, which has become a research hotspot in recent years. A measurement system of passive optical fiber DC current sensor based on the thin film sensors is designed in this article. Designs of electric-heating converter, heating-light converter and low-voltage measurement display system are introduced in detail. Experimental results indicate that the general linear correlation between the time constant of fluorescent lifetime and the voltage across the thin film resistor. The feasibility of measurement system is verified via the results of the experiment.

Design and Evaluation of a High-Accuracy Measurement System for Sheet Resistance of Thin Films

2014 ◽  
Vol 609-610 ◽  
pp. 106-112 ◽  
Author(s):  
Hai Bin Pan ◽  
Jian Ning Ding ◽  
Bao Guo Cao ◽  
Guang Gui Cheng
Keyword(s):  
Thin Films ◽  
Sheet Resistance ◽  
Measurement System ◽  
High Accuracy ◽  
Voltage Measurement ◽  
Switching Circuit ◽  
Digital Output ◽  
Accuracy Measurement ◽  
Output Module ◽  
High Accuracy Measurement

Inspection and measurement for the sheet resistance and resistivity play a pivotal role in the semiconductor industry. In this study, a high-accuracy measurement system for sheet resistance of thin films was designed based on dual-measurement with four-point probe method. The measurement system was composed of a special switching circuit, a digital output module, Keithley 2400 SourceMeter, and a computer running LabVIEW. The special switching circuit designed based on the multiplexer played an important role in current probes and voltage probes automatic switching under the control of virtual instrumentation software LabVIEW and National instruments digital output module hardware NI 9401. Keithley 2400 SourceMeter controlled by LabVIEW was used for two-times high-precision voltage measurement. Van der Pauw correction factor were calculated based on the results of the two-times voltage measurement. Then the sheet resistance of thin films was calculated by LabVIEW softwares powerful computing. The experimental results show that the designed and developed system can meet the needs of fast on-line measurement of thin films sheet resistance with a wide range, and moreover, the accuracy of measurements and the level of automatization have been dramatically improved compared to the conventional measurement system.

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