SoC Test Architecture Design and Optimization Considering Power Supply Noise Effects

2008 IEEE International Test Conference ◽

10.1109/test.2008.4700620 ◽

2008 ◽

Author(s):

Feng Yuan ◽

Qiang Xu

Keyword(s):

Power Supply ◽

Architecture Design ◽

Power Supply Noise ◽

Noise Effects ◽

Design And Optimization ◽

Soc Test ◽

Supply Noise ◽

Test Architecture

Download Full-text

Layout-Aware Critical Path Delay Test Under Maximum Power Supply Noise Effects

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems ◽

10.1109/tcad.2011.2163159 ◽

2011 ◽

Vol 30 (12) ◽

pp. 1923-1934 ◽

Cited By ~ 18

Author(s):

Junxia Ma ◽

Mohammad Tehranipoor

Keyword(s):

Power Supply ◽

Critical Path ◽

Maximum Power ◽

Path Delay ◽

Power Supply Noise ◽

Delay Test ◽

Noise Effects ◽

Critical Path Delay ◽

Supply Noise ◽

Path Delay Test

Download Full-text

Delay testing considering power supply noise effects

International Test Conference 1999. Proceedings (IEEE Cat. No.99CH37034) ◽

10.1109/test.1999.805629 ◽

2003 ◽

Cited By ~ 24

Author(s):

A. Krstic ◽

Yi-Min Jiang ◽

Kwang-Ting Cheng

Keyword(s):

Power Supply ◽

Delay Testing ◽

Power Supply Noise ◽

Noise Effects ◽

Supply Noise

Download Full-text

An analytical propagation delay model with power supply noise effects

2006 IEEE International Conference on Acoustics Speed and Signal Processing Proceedings ◽

10.1109/iscas.2006.1692664 ◽

2006 ◽

Cited By ~ 3

Author(s):

M. Pude ◽

C. Washburn ◽

P.R. Mukund ◽

K. Abe ◽

Y. Nishi

Keyword(s):

Power Supply ◽

Propagation Delay ◽

Delay Model ◽

Power Supply Noise ◽

Noise Effects ◽

Supply Noise

Download Full-text

Dynamic timing analysis considering power supply noise effects

Proceedings IEEE 2000 First International Symposium on Quality Electronic Design (Cat. No. PR00525) ◽

10.1109/isqed.2000.838866 ◽

2002 ◽

Cited By ~ 5

Author(s):

Y.-M. Jiang ◽

A. Krstic ◽

K.-T. Cheng

Keyword(s):

Power Supply ◽

Timing Analysis ◽

Power Supply Noise ◽

Noise Effects ◽

Supply Noise

Download Full-text

Layout-aware pseudo-functional testing for critical paths considering power supply noise effects

2010 Design, Automation & Test in Europe Conference & Exhibition (DATE 2010) ◽

10.1109/date.2010.5457037 ◽

2010 ◽

Cited By ~ 3

Author(s):

Xiao Liu ◽

Yubin Zhang ◽

Feng Yuan ◽

Qiang Xu

Keyword(s):

Power Supply ◽

Functional Testing ◽

Power Supply Noise ◽

Noise Effects ◽

Supply Noise ◽

Critical Paths

Download Full-text

On-chip design techniques for reducing power supply noise effects on ADC with chip-PCB hierarchical structure

2012 IEEE International Symposium on Electromagnetic Compatibility ◽

10.1109/isemc.2012.6351672 ◽

2012 ◽

Author(s):

Bumhee Bae ◽

Jonghyun Cho ◽

Joungho Kim

Keyword(s):

Hierarchical Structure ◽

Power Supply ◽

Reducing Power ◽

Power Supply Noise ◽

Chip Design ◽

Noise Effects ◽

Supply Noise ◽

On Chip ◽

Design Techniques

Download Full-text

Call for Papers: Special Issue on IR-Drop and Power Supply Noise Effects on Design and Test of Very Deep-Submicron Designs

IEEE Design & Test of Computers ◽

10.1109/mdt.2006.115 ◽

2006 ◽

Vol 23 (5) ◽

pp. 413-413

Keyword(s):

Power Supply ◽

Deep Submicron ◽

Power Supply Noise ◽

Special Issue ◽

Noise Effects ◽

Ir Drop ◽

Supply Noise

Download Full-text

Hybrid modeling and analysis of power supply noise effects on analog-to-digital converter considering hierarchical PDNs

2010 IEEE Electrical Design of Advanced Package & Systems Symposium ◽

10.1109/edaps.2010.5682997 ◽

2010 ◽

Cited By ~ 4

Author(s):

Bumhee Bae ◽

Yujeong Shim ◽

Woojin Lee ◽

Kyoungchoul Koo ◽

Woojin Ahn ◽

...

Keyword(s):

Power Supply ◽

Hybrid Modeling ◽

Analog To Digital Converter ◽

Power Supply Noise ◽

Digital Converter ◽

Noise Effects ◽

Analog To Digital ◽

Modeling And Analysis ◽

Supply Noise

Download Full-text

Pseudo-functional testing for small delay defects considering power supply noise effects

2011 IEEE/ACM International Conference on Computer-Aided Design (ICCAD) ◽

10.1109/iccad.2011.6105302 ◽

2011 ◽

Cited By ~ 9

Author(s):

Feng Yuan ◽

Xiao Liu ◽

Qiang Xu

Keyword(s):

Power Supply ◽

Functional Testing ◽

Power Supply Noise ◽

Noise Effects ◽

Small Delay Defects ◽

Supply Noise ◽

Small Delay ◽

Delay Defects

Download Full-text

Path selection and pattern generation for dynamic timing analysis considering power supply noise effects

IEEE/ACM International Conference on Computer Aided Design. ICCAD - 2000. IEEE/ACM Digest of Technical Papers (Cat. No.00CH37140) ◽

10.1109/iccad.2000.896521 ◽

2002 ◽

Cited By ~ 14

Author(s):

Jing-Jia Liou ◽

A. Krstic ◽

Yi-Min Jiang ◽

Kwang-Ting Cheng

Keyword(s):

Power Supply ◽

Timing Analysis ◽

Path Selection ◽

Pattern Generation ◽

Power Supply Noise ◽

Noise Effects ◽

Supply Noise

Download Full-text