Reducing Power Supply Noise in Linear-Decompressor-Based Test Data Compression Environment for At-Speed Scan Testing

2008 IEEE International Test Conference ◽

10.1109/test.2008.4700584 ◽

2008 ◽

Cited By ~ 1

Author(s):

Meng-Fan Wu ◽

Jiun-Lang Huang ◽

Xiaoqing Wen ◽

K. Miyase

Keyword(s):

Data Compression ◽

Test Data ◽

Power Supply ◽

Reducing Power ◽

Power Supply Noise ◽

Test Data Compression ◽

Scan Testing ◽

Supply Noise

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Efficient Test Data Compression and Low Power Scan Testing in SoCs

ETRI Journal ◽

10.4218/etrij.03.0303.0017 ◽

2003 ◽

Vol 25 (5) ◽

pp. 321-327 ◽

Cited By ~ 1

Author(s):

Jun-Mo Jung ◽

Jong-Wha Chong

Keyword(s):

Low Power ◽

Data Compression ◽

Test Data ◽

Test Data Compression ◽

Scan Testing ◽

Efficient Test

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On-chip design techniques for reducing power supply noise effects on ADC with chip-PCB hierarchical structure

2012 IEEE International Symposium on Electromagnetic Compatibility ◽

10.1109/isemc.2012.6351672 ◽

2012 ◽

Author(s):

Bumhee Bae ◽

Jonghyun Cho ◽

Joungho Kim

Keyword(s):

Hierarchical Structure ◽

Power Supply ◽

Reducing Power ◽

Power Supply Noise ◽

Chip Design ◽

Noise Effects ◽

Supply Noise ◽

On Chip ◽

Design Techniques

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Hybrid test data compression technique for SOC scan testing

2005 Joint 30th International Conference on Infrared and Millimeter Waves and 13th International Conference on Terahertz Electronics ◽

10.1109/socc.2005.1554457 ◽

2005 ◽

Author(s):

Sangwook Cho ◽

Jaehoon Song ◽

Hyunbean Yi ◽

Sungju Park

Keyword(s):

Data Compression ◽

Test Data ◽

Test Data Compression ◽

Compression Technique ◽

Scan Testing ◽

Hybrid Test

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A novel scheme to reduce power supply noise for high-quality at-speed scan testing

2007 IEEE International Test Conference ◽

10.1109/test.2007.4437632 ◽

2007 ◽

Cited By ~ 2

Author(s):

Xiaoqing Wen ◽

Kohei Miyase ◽

Seiji Kajihara ◽

Tatsuya Suzuki ◽

Yuta Yamato ◽

...

Keyword(s):

Power Supply ◽

Power Supply Noise ◽

High Quality ◽

Scan Testing ◽

Supply Noise

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A layout-aware x-filling approach for dynamic power supply noise reduction in at-speed scan testing

2013 18TH IEEE EUROPEAN TEST SYMPOSIUM (ETS) ◽

10.1109/ets.2013.6569356 ◽

2013 ◽

Cited By ~ 8

Author(s):

Saman Kiamehr ◽

Farshad Firouzi ◽

Mehdi B. Tahoori

Keyword(s):

Noise Reduction ◽

Power Supply ◽

Power Supply Noise ◽

Scan Testing ◽

Dynamic Power ◽

Supply Noise

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A Test Data Compression Scheme for Reducing Power Based on OLELC and NBET

Lecture Notes in Computer Science - Advanced Intelligent Computing Theories and Applications. With Aspects of Theoretical and Methodological Issues ◽

10.1007/978-3-540-87442-3_90 ◽

2008 ◽

pp. 728-735

Author(s):

Jun Ma

Keyword(s):

Data Compression ◽

Test Data ◽

Reducing Power ◽

Test Data Compression ◽

Compression Scheme

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Low-power scan testing and test data compression for system-on-a-chip

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems ◽

10.1109/43.998630 ◽

2002 ◽

Vol 21 (5) ◽

pp. 597-604 ◽

Cited By ~ 71

Author(s):

A. Chandra ◽

K. Chakrabarty

Keyword(s):

Low Power ◽

Data Compression ◽

Test Data ◽

Test Data Compression ◽

Scan Testing ◽

System On A Chip

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Combining low-power scan testing and test data compression for system-on-a-chip

Proceedings of the 38th Design Automation Conference (IEEE Cat. No.01CH37232) ◽

10.1109/dac.2001.935497 ◽

2002 ◽

Author(s):

A. Chandra ◽

K. Chakrabarty

Keyword(s):

Low Power ◽

Data Compression ◽

Test Data ◽

Test Data Compression ◽

Scan Testing ◽

System On A Chip

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Low-Power Scan Testing for Test Data Compression Using a Routing-Driven Scan Architecture

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems ◽

10.1109/tcad.2009.2018775 ◽

2009 ◽

Vol 28 (7) ◽

pp. 1101-1105 ◽

Cited By ~ 17

Author(s):

Dong Xiang ◽

Dianwei Hu ◽

Qiang Xu ◽

A. Orailoglu

Keyword(s):

Low Power ◽

Data Compression ◽

Test Data ◽

Test Data Compression ◽

Scan Testing

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Power Supply Noise Reduction for At-Speed Scan Testing in Linear-Decompression Environment

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems ◽

10.1109/tcad.2009.2030440 ◽

2009 ◽

Vol 28 (11) ◽

pp. 1767-1776 ◽

Cited By ~ 14

Author(s):

Meng-Fan Wu ◽

Jiun-Lang Huang ◽

Xiaoqing Wen ◽

Kohei Miyase

Keyword(s):

Noise Reduction ◽

Power Supply ◽

Power Supply Noise ◽

Scan Testing ◽

Supply Noise

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