A novel scheme to reduce power supply noise for high-quality at-speed scan testing

2007 IEEE International Test Conference ◽

10.1109/test.2007.4437632 ◽

2007 ◽

Cited By ~ 2

Author(s):

Xiaoqing Wen ◽

Kohei Miyase ◽

Seiji Kajihara ◽

Tatsuya Suzuki ◽

Yuta Yamato ◽

...

Keyword(s):

Power Supply ◽

Power Supply Noise ◽

High Quality ◽

Scan Testing ◽

Supply Noise

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Reducing Power Supply Noise in Linear-Decompressor-Based Test Data Compression Environment for At-Speed Scan Testing

2008 IEEE International Test Conference ◽

10.1109/test.2008.4700584 ◽

2008 ◽

Cited By ~ 1

Author(s):

Meng-Fan Wu ◽

Jiun-Lang Huang ◽

Xiaoqing Wen ◽

K. Miyase

Keyword(s):

Data Compression ◽

Test Data ◽

Power Supply ◽

Reducing Power ◽

Power Supply Noise ◽

Test Data Compression ◽

Scan Testing ◽

Supply Noise

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A layout-aware x-filling approach for dynamic power supply noise reduction in at-speed scan testing

2013 18TH IEEE EUROPEAN TEST SYMPOSIUM (ETS) ◽

10.1109/ets.2013.6569356 ◽

2013 ◽

Cited By ~ 8

Author(s):

Saman Kiamehr ◽

Farshad Firouzi ◽

Mehdi B. Tahoori

Keyword(s):

Noise Reduction ◽

Power Supply ◽

Power Supply Noise ◽

Scan Testing ◽

Dynamic Power ◽

Supply Noise

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Power Supply Noise Reduction for At-Speed Scan Testing in Linear-Decompression Environment

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems ◽

10.1109/tcad.2009.2030440 ◽

2009 ◽

Vol 28 (11) ◽

pp. 1767-1776 ◽

Cited By ~ 14

Author(s):

Meng-Fan Wu ◽

Jiun-Lang Huang ◽

Xiaoqing Wen ◽

Kohei Miyase

Keyword(s):

Noise Reduction ◽

Power Supply ◽

Power Supply Noise ◽

Scan Testing ◽

Supply Noise

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Power Supply Noise Reduction in Broadcast-Based Compression Environment for At-speed Scan Testing

2010 19th IEEE Asian Test Symposium ◽

10.1109/ats.2010.68 ◽

2010 ◽

Cited By ~ 3

Author(s):

Chun-Yong Liang ◽

Meng-Fan Wu ◽

Jiun-Lang Huang

Keyword(s):

Noise Reduction ◽

Power Supply ◽

Power Supply Noise ◽

Scan Testing ◽

Supply Noise

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Power supply noise and its reduction in at-speed scan testing

2015 IEEE 11th International Conference on ASIC (ASICON) ◽

10.1109/asicon.2015.7516980 ◽

2015 ◽

Author(s):

Xiaoqing Wen

Keyword(s):

Power Supply ◽

Power Supply Noise ◽

Scan Testing ◽

Supply Noise

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AC Power Supply Noise Simulation of CMOS Microprocessor with LSI Chip-Package-Board Integrated Model

IEICE Transactions on Electronics ◽

10.1587/transele.e97.c.264 ◽

2014 ◽

Vol E97.C (4) ◽

pp. 264-271 ◽

Cited By ~ 1

Author(s):

Kumpei YOSHIKAWA ◽

Kouji ICHIKAWA ◽

Makoto NAGATA

Keyword(s):

Power Supply ◽

Integrated Model ◽

Power Supply Noise ◽

Supply Noise ◽

Noise Simulation ◽

Ac Power

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Power-Supply-Noise-Aware Timing Analysis and Test Pattern Regeneration

IEICE Transactions on Fundamentals of Electronics Communications and Computer Sciences ◽

10.1587/transfun.e99.a.2320 ◽

2016 ◽

Vol E99.A (12) ◽

pp. 2320-2327

Author(s):

Cheng-Yu HAN ◽

Yu-Ching LI ◽

Hao-Tien KAN ◽

James Chien-Mo LI

Keyword(s):

Power Supply ◽

Test Pattern ◽

Timing Analysis ◽

Power Supply Noise ◽

Supply Noise

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Power Supply Noise-Aware Scan Test Pattern Reshaping for At-Speed Delay Fault Testing of Monolithic 3D ICs *

2020 IEEE 29th Asian Test Symposium (ATS) ◽

10.1109/ats49688.2020.9301568 ◽

2020 ◽

Author(s):

Shao-Chun Hung ◽

Yi-Chen Lu ◽

Sung Kyu Lim ◽

Krishnendu Chakrabarty

Keyword(s):

Power Supply ◽

Test Pattern ◽

Power Supply Noise ◽

Fault Testing ◽

Delay Fault ◽

Delay Fault Testing ◽

3D Ics ◽

Scan Test ◽

Supply Noise

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A GALS Design with Opposite-Phase Local Clock Assignment for Power Supply Noise Reduction

2018 IEEE Asia Pacific Conference on Circuits and Systems (APCCAS) ◽

10.1109/apccas.2018.8605670 ◽

2018 ◽

Author(s):

Nguyen Van Toan ◽

Dam Minh Tung ◽

Jeong-Gun Lee

Keyword(s):

Noise Reduction ◽

Power Supply ◽

Power Supply Noise ◽

Local Clock ◽

Opposite Phase ◽

Supply Noise

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Single-chip multi-processor integrating quadruple 8-way vliw processors with interface timing analysis considering power supply noise

Asia and South Pacific Conference on Design Automation, 2006. ◽

10.1109/aspdac.2006.1594741 ◽

2006 ◽

Author(s):

S. Imai ◽

A. Inoue ◽

M. Matsumura ◽

K. Kawasaki ◽

A. Suga

Keyword(s):

Power Supply ◽

Timing Analysis ◽

Power Supply Noise ◽

Single Chip ◽

Vliw Processors ◽

Supply Noise

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