A layout-aware x-filling approach for dynamic power supply noise reduction in at-speed scan testing
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2009 ◽
Vol 28
(11)
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pp. 1767-1776
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Keyword(s):
2005 ◽
Vol E88-C
(8)
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pp. 1734-1739
2005 ◽
Vol E88-A
(12)
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pp. 3421-3428
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2009 ◽
Vol 9
(1)
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pp. 29-36
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