Pattern-directed circuit virtual partitioning for test power reduction

2007 IEEE International Test Conference ◽

10.1109/test.2007.4437633 ◽

2007 ◽

Cited By ~ 1

Author(s):

Qiang Xu ◽

Dianwei Hu ◽

Dong Xiang

Keyword(s):

Power Reduction ◽

Test Power ◽

Test Power Reduction ◽

Directed Circuit

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Test power reduction and test pattern generation for multiple faults using zero suppressed decision diagrams

International Journal of High Performance Systems Architecture ◽

10.1504/ijhpsa.2016.076204 ◽

2016 ◽

Vol 6 (1) ◽

pp. 51 ◽

Cited By ~ 3

Author(s):

J.P. Anita ◽

P. Sudheesh

Keyword(s):

Test Pattern ◽

Power Reduction ◽

Pattern Generation ◽

Test Pattern Generation ◽

Decision Diagrams ◽

Test Power ◽

Multiple Faults ◽

Test Power Reduction

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Multiple Fault Diagnosis and Test Power Reduction Using Genetic Algorithms

Eco-friendly Computing and Communication Systems - Communications in Computer and Information Science ◽

10.1007/978-3-642-32112-2_11 ◽

2012 ◽

pp. 84-92 ◽

Cited By ~ 2

Author(s):

J. P. Anita ◽

P. T. Vanathi

Keyword(s):

Genetic Algorithms ◽

Fault Diagnosis ◽

Power Reduction ◽

Test Power ◽

Multiple Fault ◽

Multiple Fault Diagnosis ◽

Test Power Reduction

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Fault Diagnosis Using Automatic Test Pattern Generation and Test Power Reduction Technique for VLSI Circuits

2019 3rd International Conference on Trends in Electronics and Informatics (ICOEI) ◽

10.1109/icoei.2019.8862751 ◽

2019 ◽

Author(s):

Ch. Narasimha Kumar ◽

A. Madhumitha ◽

N. Sesi Preetam ◽

P. Vamsi Gupta ◽

J.P. Anita

Keyword(s):

Fault Diagnosis ◽

Test Pattern ◽

Power Reduction ◽

Pattern Generation ◽

Reduction Technique ◽

Vlsi Circuits ◽

Test Pattern Generation ◽

Automatic Test Pattern Generation ◽

Test Power ◽

Test Power Reduction

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Circuit Design Methodologies for Test Power Reduction in Nano-Scaled Technologies

Lecture Notes in Electrical Engineering - Proceedings of International Conference on VLSI, Communication, Advanced Devices, Signals & Systems and Networking (VCASAN-2013) ◽

10.1007/978-81-322-1524-0_20 ◽

2013 ◽

pp. 139-149

Author(s):

Veena S. Chakravarthi ◽

Swaroop Ghosh

Keyword(s):

Circuit Design ◽

Power Reduction ◽

Test Power ◽

Design Methodologies ◽

Test Power Reduction

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A routability constrained scan chain ordering technique for test power reduction

Asia and South Pacific Conference on Design Automation, 2006. ◽

10.1145/1118299.1118453 ◽

2006 ◽

Cited By ~ 1

Author(s):

X.-L. Huang ◽

J.-L. Huang

Keyword(s):

Power Reduction ◽

Test Power ◽

Test Power Reduction ◽

Scan Chain ◽

Chain Ordering

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Genetic Algorithm based Scan Chain Optimization and Test Power Reduction using Physical Information

TENCON 2006 - 2006 IEEE Region 10 Conference ◽

10.1109/tencon.2006.344008 ◽

2006 ◽

Cited By ~ 4

Author(s):

Barun Bikash Paul ◽

Rajdeep Mukhopadhyay ◽

Indranil Sen Gupta

Keyword(s):

Genetic Algorithm ◽

Power Reduction ◽

Test Power ◽

Physical Information ◽

Test Power Reduction ◽

Scan Chain

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Test power reduction via deterministic alignment of stimulus and response bits

2011 12th Latin American Test Workshop (LATW) ◽

10.1109/latw.2011.5985911 ◽

2011 ◽

Cited By ~ 3

Author(s):

Sobeeh Almukhaizim ◽

Eman AlQuraishi ◽

Ozgur Sinanoglu

Keyword(s):

Power Reduction ◽

Test Power ◽

Test Power Reduction

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Test Power Reduction with Multiple Capture Orders

13th Asian Test Symposium ◽

10.1109/ats.2004.82 ◽

2005 ◽

Cited By ~ 32

Author(s):

Kuen-Jong Lee ◽

Shaing-Jer Hsu ◽

Chia-Ming Ho

Keyword(s):

Power Reduction ◽

Test Power ◽

Test Power Reduction

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Test Power Reduction Using Integrated Scan Cell and Test Vector Reordering Techniques on Linear Scan and Double Tree Scan Architectures

Journal of Low Power Electronics ◽

10.1166/jolpe.2009.1001 ◽

2009 ◽

Vol 5 (1) ◽

pp. 58-68 ◽

Cited By ~ 1

Author(s):

George Kurian ◽

Narayana Rao ◽

Virendra Patidar ◽

V. Kamakoti ◽

Srivaths Ravi

Keyword(s):

Power Reduction ◽

Test Vector ◽

Test Power ◽

Test Power Reduction

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CooLBIST: An Effective Approach of Test Power Reduction for LBIST

2008 17th Asian Test Symposium ◽

10.1109/ats.2008.36 ◽

2008 ◽

Author(s):

Jun Matsushima ◽

Yoichi Maeda ◽

Masahiro Takakura

Keyword(s):

Power Reduction ◽

Test Power ◽

Test Power Reduction

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