Tri-scan: a novel DFT technique for CMOS path delay fault testing

2005 ◽  
Author(s):  
R. Datta ◽  
Ravi Gupta ◽  
A. Sebastine ◽  
J.A. Abraham ◽  
M. d'Abreu
Keyword(s):  
Path Delay ◽  
Fault Testing ◽  
Delay Fault ◽  
Delay Fault Testing ◽  
Path Delay Fault ◽  
Path Delay Fault Testing

scholarly journals Path delay fault testing of multiplexer-based shifters

2001 ◽  
Vol 88 (8) ◽  
pp. 923-937
Author(s):  
H. T. Vergos ◽  
Y. Tsiatouhas ◽  
Th. Haniotakis ◽  
D. Nikolos ◽  
M. Nicolaidis
Keyword(s):  
Path Delay ◽  
Fault Testing ◽  
Delay Fault ◽  
Delay Fault Testing ◽  
Path Delay Fault ◽  
Path Delay Fault Testing

scholarly journals On path delay fault testing of multiplexer-based shifters

2003 ◽  
Author(s):  
H.T. Vergos ◽  
Y. Tsiatouhas ◽  
T. Haniotakis ◽  
D. Nikolos ◽  
M. Nicolaidis
Keyword(s):  
Path Delay ◽  
Fault Testing ◽  
Delay Fault ◽  
Delay Fault Testing ◽  
Path Delay Fault ◽  
Path Delay Fault Testing

An efficient built-in self test method for robust path delay fault testing

1996 ◽  
Vol 8 (2) ◽  
pp. 219-222 ◽  
Author(s):  
Ioannis Voyiatzis ◽  
Antonis Paschalis ◽  
Dimitrios Nikolos ◽  
Constantin Halatsis
Keyword(s):  
Test Method ◽  
Path Delay ◽  
Fault Testing ◽  
Delay Fault ◽  
Delay Fault Testing ◽  
Path Delay Fault ◽  
Self Test ◽  
Path Delay Fault Testing ◽  
Built In Self Test
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