Register-transfer level fault modeling and test evaluation techniques for VLSI circuits

Author(s):  
P.A. Thaker ◽  
V.D. Agrawal ◽  
M.E. Zaghloul
2021 ◽  
Author(s):  
Johannes Muller ◽  
Mohammad Rahmani Fadiheh ◽  
Anna Lena Duque Anton ◽  
Thomas Eisenbarth ◽  
Dominik Stoffel ◽  
...  

Sign in / Sign up

Export Citation Format

Share Document