Industrial evaluation of stress combinations for march tests applied to SRAMs

Author(s):  
I. Schanstra ◽  
A.J. Van De Goor
Informatics ◽  
2021 ◽  
Vol 18 (1) ◽  
pp. 25-42
Author(s):  
V. N. Yarmolik ◽  
V. A. Levantsevich ◽  
D. V. Demenkovets ◽  
I. Mrozek

The urgency of the problem of testing storage devices of modern computer systems is shown. The mathematical models of their faults and the methods used for testing the most complex cases by classical march tests are investigated. Passive pattern sensitive faults (PNPSFk) are allocated, in which arbitrary k from N memory cells participate, where k << N, and N is the memory capacity in bits. For these faults, analytical expressions are given for the minimum and maximum fault coverage that is achievable within the march tests. The concept of a primitive is defined, which describes in terms of march test elements the conditions for activation and fault detection of PNPSFk of storage devices. Examples of march tests with maximum fault coverage, as well as march tests with a minimum time complexity equal to 18N are given. The efficiency of a single application of tests such as MATS ++, March C− and March PS is investigated for different number of k ≤ 9 memory cells involved in PNPSFk fault. The applicability of multiple testing with variable address sequences is substantiated, when the use of random sequences of addresses is proposed. Analytical expressions are given for the fault coverage of complex PNPSFk faults depending on the multiplicity of the test. In addition, the estimates of the mean value of the multiplicity of the MATS++, March C− and March PS tests, obtained on the basis of a mathematical model describing the problem of the coupon collector, and ensuring the detection of all k2k PNPSFk faults are given. The validity of analytical estimates is experimentally shown and the high efficiency of PNPSFk fault detection is confirmed by tests of the March PS type.


Author(s):  
Simone Alpe ◽  
Stefano Di Carlo ◽  
Paolo Prinetto ◽  
Alessandro Savino
Keyword(s):  

1998 ◽  
Vol 72 (1) ◽  
pp. 13-18 ◽  
Author(s):  
CARLA M. SGRÒ ◽  
ARY A. HOFFMANN

To test whether stressful conditions altered levels of heritable variation in fecundity in Drosophila melanogaster, parent–offspring comparisons were undertaken across three generations for flies reared in a combined stress (ethanol, cold shock, low nutrition) environment or a control environment. The stressful conditions did not directly influence fecundity but did lead to a reduced fecundity in the offspring generations, perhaps reflecting cross-generation maternal effects. Both the heritability and evolvability estimates were higher in the combined stress treatment, reflecting an apparent increase in the additive genetic variance under stress. In contrast, there were no consistent changes in the environmental variance across environments.


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