Proceedings Eighth Asian Test Symposium (ATS'99)
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Published By IEEE Comput. Soc

0769503152

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March tests for word-oriented two-port memories

Proceedings Eighth Asian Test Symposium (ATS'99) ◽

10.1109/ats.1999.810729 ◽

2003 ◽

Cited By ~ 2

Author(s):

S. Hamdioui ◽

A.J. van de Goor

Keyword(s):

March Tests

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Accelerating test data processing

Proceedings Eighth Asian Test Symposium (ATS'99) ◽

10.1109/ats.1999.810738 ◽

2003 ◽

Author(s):

S. Demidenko ◽

K. Lever

Keyword(s):

Data Processing ◽

Test Data

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On an effective selection of IDDQ measurement vectors for sequential circuits

Proceedings Eighth Asian Test Symposium (ATS'99) ◽

10.1109/ats.1999.810743 ◽

2003 ◽

Author(s):

H. Ichihara ◽

K. Kinoshita ◽

S. Kajihara

Keyword(s):

Sequential Circuits ◽

Effective Selection ◽

Selection Of

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How to design an environment simulator for safety critical software testing

Proceedings Eighth Asian Test Symposium (ATS'99) ◽

10.1109/ats.1999.810760 ◽

2003 ◽

Author(s):

Haiying Tu ◽

Fangmei Wu

Keyword(s):

Software Testing ◽

Safety Critical

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Research and implementation of a high speed test generation for ultra large scale combinational circuits

Proceedings Eighth Asian Test Symposium (ATS'99) ◽

10.1109/ats.1999.810731 ◽

2003 ◽

Author(s):

Zhide Zeng ◽

Jihua Chen ◽

Hefeng Cao

Keyword(s):

Test Generation ◽

High Speed ◽

Large Scale ◽

Combinational Circuits ◽

Speed Test

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Minimizing the number of test configurations for different FPGA families

Proceedings Eighth Asian Test Symposium (ATS'99) ◽

10.1109/ats.1999.810776 ◽

2003 ◽

Cited By ~ 21

Author(s):

M. Renovell ◽

J.M. Portal ◽

J. Figuras ◽

Y. Zorian

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High resolution CD-SEM system

Proceedings Eighth Asian Test Symposium (ATS'99) ◽

10.1109/ats.1999.810779 ◽

2003 ◽

Author(s):

Y. Ose ◽

M. Ezumi ◽

H. Todokoro

Keyword(s):

High Resolution

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Scenario based integration testing for object-oriented software development

Proceedings Eighth Asian Test Symposium (ATS'99) ◽

10.1109/ats.1999.810764 ◽

2003 ◽

Cited By ~ 1

Author(s):

Youngchul Kim ◽

C.R. Carlson

Keyword(s):

Software Development ◽

Object Oriented ◽

Integration Testing

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Procedure to overcome the Byzantine General's problem for bridging faults in CMOS circuits

Proceedings Eighth Asian Test Symposium (ATS'99) ◽

10.1109/ats.1999.810739 ◽

2003 ◽

Cited By ~ 3

Author(s):

A. Keshk ◽

Y. Miura ◽

K. Kinoshita

Keyword(s):

Cmos Circuits ◽

Bridging Faults

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Identification of redundant crosspoint faults in sequential PLAs with fault-free hardware reset

Proceedings Eighth Asian Test Symposium (ATS'99) ◽

10.1109/ats.1999.810762 ◽

2003 ◽

Author(s):

T. Yamada ◽

T. Kotake ◽

H. Takahashi ◽

K. Yamazaki

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Proceedings Eighth Asian Test Symposium (ATS'99)Latest Publications

TOTAL DOCUMENTS

H-INDEX

Published By IEEE Comput. Soc

March tests for word-oriented two-port memories

Accelerating test data processing

On an effective selection of IDDQ measurement vectors for sequential circuits

How to design an environment simulator for safety critical software testing

Research and implementation of a high speed test generation for ultra large scale combinational circuits

Minimizing the number of test configurations for different FPGA families

High resolution CD-SEM system

Scenario based integration testing for object-oriented software development

Procedure to overcome the Byzantine General's problem for bridging faults in CMOS circuits

Identification of redundant crosspoint faults in sequential PLAs with fault-free hardware reset

Proceedings Eighth Asian Test Symposium (ATS'99)
Latest Publications