Increased CMOS IC stuck-at fault coverage with reduced I/sub DDQ/ test sets

Proceedings. International Test Conference 1990 ◽

10.1109/test.1990.114051 ◽

2002 ◽

Cited By ~ 14

Author(s):

R.R. Fritzemeier ◽

J.M. Soden ◽

R.K. Treece ◽

C.F. Hawkins

Keyword(s):

Fault Coverage ◽

Test Sets ◽

Cmos Ic

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Hybrid delay scan: a low hardware overhead scan-based delay test technique for high fault coverage and compact test sets

Proceedings Design, Automation and Test in Europe Conference and Exhibition ◽

10.1109/date.2004.1269074 ◽

2004 ◽

Cited By ~ 52

Author(s):

Seongmoon Wang ◽

Xiao Liu ◽

S.T. Chakradhar

Keyword(s):

Fault Coverage ◽

Delay Test ◽

Test Technique ◽

Hardware Overhead ◽

Test Sets ◽

Compact Test

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Algorithms to compute bridging fault coverage of I DDQ test sets

ACM Transactions on Design Automation of Electronic Systems ◽

10.1145/264995.264999 ◽

1997 ◽

Vol 2 (3) ◽

pp. 281-305 ◽

Cited By ~ 3

Author(s):

Paul Thadikaran ◽

Sreejit Chakravarty ◽

Janak Patel

Keyword(s):

Fault Coverage ◽

Bridging Fault ◽

Test Sets

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Estimating the relative single stuck-at fault coverage of test sets for a combinational logic block from its functional description

Sixth IEEE International High-Level Design Validation and Test Workshop ◽

10.1109/hldvt.2001.972804 ◽

2002 ◽

Cited By ~ 1

Author(s):

I. Pomeranz ◽

S.M. Reddy

Keyword(s):

Fault Coverage ◽

Combinational Logic ◽

Functional Description ◽

Logic Block ◽

Test Sets

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Maximal multiple fault coverage using single fault test sets

Proceedings of Eighth International Application Specific Integrated Circuits Conference ◽

10.1109/asic.1995.580720 ◽

2002 ◽

Author(s):

A.-F. Yousif ◽

J. Gu

Keyword(s):

Fault Coverage ◽

Multiple Fault ◽

Single Fault ◽

Test Sets

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Fast Enhancement of Validation Test Sets to Improve Stuck-at Fault Coverage for RTL circuits

20th International Conference on VLSI Design held jointly with 6th International Conference on Embedded Systems (VLSID'07) ◽

10.1109/vlsid.2007.82 ◽

2007 ◽

Author(s):

L. Lingappan ◽

V. Gangaram ◽

N. Jha

Keyword(s):

Fault Coverage ◽

Validation Test ◽

Test Sets

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On quality of test sets: relating fault coverage to defect coverage

2001 IEEE Autotestcon Proceedings. IEEE Systems Readiness Technology Conference. (Cat. No.01CH37237) ◽

10.1109/autest.2001.949464 ◽

2002 ◽

Author(s):

A.L. D'souzat ◽

M.S. Hsiao

Keyword(s):

Fault Coverage ◽

Defect Coverage ◽

Test Sets

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Fast Enhancement of Validation Test Sets for Improving the Stuck-at Fault Coverage of RTL Circuits

IEEE Transactions on Very Large Scale Integration (VLSI) Systems ◽

10.1109/tvlsi.2009.2013981 ◽

2009 ◽

Vol 17 (5) ◽

pp. 697-708 ◽

Cited By ~ 1

Author(s):

L. Lingappan ◽

V. Gangaram ◽

N.K. Jha ◽

S. Chakravarty

Keyword(s):

Fault Coverage ◽

Validation Test ◽

Test Sets

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Linguistische Fairness und differentielle Validität des Auditiven Wortlisten Lerntests (AWLT) bei Demenz vom Alzheimer-Typ

Diagnostica ◽

10.1026/0012-1924/a000227 ◽

2019 ◽

Vol 65 (4) ◽

pp. 193-204

Author(s):

Johannes Baltasar Hessler ◽

David Brieber ◽

Johanna Egle ◽

Georg Mandler ◽

Thomas Jahn

Keyword(s):

Cognitive Functions ◽

Kognitive Funktionen ◽

Alzheimer Demenz ◽

Test Sets

Zusammenfassung. Der Auditive Wortlisten Lerntest (AWLT) ist Teil des Test-Sets Kognitive Funktionen Demenz (CFD; Cognitive Functions Dementia) im Rahmen des Wiener Testsystems (WTS). Der AWLT wurde entlang neurolinguistischer Kriterien entwickelt, um Interaktionen zwischen dem kognitiven Status der Testpersonen und den linguistischen Eigenschaften der Lernliste zu reduzieren. Anhand einer nach Alter, Bildung und Geschlecht parallelisierten Stichprobe von gesunden Probandinnen und Probanden ( N = 44) und Patientinnen und Patienten mit Alzheimer Demenz ( N = 44) wurde mit ANOVAs für Messwiederholungen überprüft, inwieweit dieses Konstruktionsziel erreicht wurde. Weiter wurde die Fähigkeit der Hauptvariablen des AWLT untersucht, zwischen diesen Gruppen zu unterscheiden. Es traten Interaktionen mit geringer Effektstärke zwischen linguistischen Eigenschaften und der Diagnose auf. Die Hauptvariablen trennten mit großen Effektstärken Patientinnen und Patienten von Gesunden. Der AWLT scheint bei vergleichbarer differenzieller Validität linguistisch fairer als ähnliche Instrumente zu sein.

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A new BIST scheme with encoding logic to achieve complete fault coverage

Future Energy, Environment and Materials II ◽

10.2495/feem140451 ◽

2015 ◽

Author(s):

Ling Zhang ◽

Junjin Mei ◽

Guan-zhong Wang ◽

Tonghan Li

Keyword(s):

Fault Coverage

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Calibration of fibre optic chromatic dispersion test sets

10.3403/02302016u ◽

2015 ◽

Keyword(s):

Chromatic Dispersion ◽

Fibre Optic ◽

Dispersion Test ◽

Test Sets

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