On the Oxide Trap Density and Profiles of 1-nm EOT Metal-Gate Last CMOS Transistors Assessed by Low-Frequency Noise

2013 ◽  
Vol 60 (11) ◽  
pp. 3849-3855 ◽  
Author(s):  
Eddy Simoen ◽  
Anabela Veloso ◽  
Yuichi Higuchi ◽  
Naoto Horiguchi ◽  
Cor Claeys
Keyword(s):  
Low Frequency ◽  
Trap Density ◽  
Frequency Noise ◽  
Low Frequency Noise ◽  
Metal Gate ◽  
Cmos Transistors ◽  
Oxide Trap

Low-Frequency Noise Investigation and Noise Variability Analysis in High- $k$/Metal Gate 32-nm CMOS Transistors

2011 ◽  
Vol 58 (8) ◽  
pp. 2310-2316 ◽  
Author(s):  
Diana Lopez ◽  
S. Haendler ◽  
C. Leyris ◽  
Gregory Bidal ◽  
Gérard Ghibaudo
Keyword(s):  
Low Frequency ◽  
Frequency Noise ◽  
Low Frequency Noise ◽  
Metal Gate ◽  
Variability Analysis ◽  
Cmos Transistors ◽  
High K

Low-Frequency Noise Assessment of the Oxide Trap Density in Thick-Oxide Input-Output Transistors for DRAM Applications

2016 ◽  
Vol 5 (6) ◽  
pp. N27-N31 ◽  
Author(s):  
E. Simoen ◽  
R. Ritzenthaler ◽  
M.-J. Cho ◽  
T. Schram ◽  
N. Horiguchi ◽  
...  
Keyword(s):  
Low Frequency ◽  
Trap Density ◽  
Frequency Noise ◽  
Low Frequency Noise ◽  
Input Output ◽  
Noise Assessment ◽  
Oxide Trap

Slow oxide trap density profile extraction using gate current low-frequency noise in ultrathin oxide MOSFETs

2007 ◽  
Vol 84 (9-10) ◽  
pp. 2382-2385 ◽  
Author(s):  
J. Armand ◽  
F. Martinez ◽  
M. Valenza ◽  
K. Rochereau ◽  
E. Vincent
Keyword(s):  
Density Profile ◽  
Low Frequency ◽  
Trap Density ◽  
Frequency Noise ◽  
Low Frequency Noise ◽  
Gate Current ◽  
Oxide Trap ◽  
Ultrathin Oxide

Low-Frequency-Noise-Based Oxide Trap Profiling in Replacement High-k/Metal-Gate pMOSFETs

2013 ◽  
Vol 58 (9) ◽  
pp. 281-292 ◽  
Author(s):  
E. R. Simoen ◽  
J.-W. Lee ◽  
A. Veloso ◽  
V. Paraschiv ◽  
N. Horiguchi ◽  
...  
Keyword(s):  
Low Frequency ◽  
Frequency Noise ◽  
Low Frequency Noise ◽  
Metal Gate ◽  
High K ◽  
Oxide Trap

New numerical low frequency noise model for front and buried oxide trap density characterization in FDSOI MOSFETs

2011 ◽  
Vol 88 (7) ◽  
pp. 1286-1290 ◽  
Author(s):  
J. El Husseini ◽  
F. Martinez ◽  
J. Armand ◽  
M. Bawedin ◽  
M. Valenza ◽  
...  
Keyword(s):  
Low Frequency ◽  
Trap Density ◽  
Noise Model ◽  
Frequency Noise ◽  
Low Frequency Noise ◽  
Buried Oxide ◽  
Oxide Trap

The Impact of Ultra Thin ALD TiN Metal Gate on Low Frequency Noise of CMOS Transistors

2007 ◽  
Author(s):  
A. Mercha ◽  
R. Singanamalla ◽  
V. Subramanian ◽  
E. Simoen ◽  
W. Sansen ◽  
...  
Keyword(s):  
Low Frequency ◽  
Frequency Noise ◽  
Low Frequency Noise ◽  
Metal Gate ◽  
Cmos Transistors ◽  
Tin Metal ◽  
The Impact

Low-Frequency-Noise-Based Oxide Trap Profiling in Replacement High-κ/Metal-Gate pMOSFETs

2014 ◽  
Vol 3 (6) ◽  
pp. Q127-Q131 ◽  
Author(s):  
E. Simoen ◽  
J. W. Lee ◽  
A. Veloso ◽  
V. Paraschiv ◽  
N. Horiguchi ◽  
...  
Keyword(s):  
Low Frequency ◽  
Frequency Noise ◽  
Low Frequency Noise ◽  
Metal Gate ◽  
Oxide Trap

Investigation of low-frequency noise of 28-nm technology process of high-k/metal gate p-MOSFETs with fluorine incorporation

2016 ◽  
Vol 115 ◽  
pp. 7-11
Author(s):  
Tsung-Hsien Kao ◽  
Shoou-Jinn Chang ◽  
Yean-Kuen Fang ◽  
Po-Chin Huang ◽  
Bo-Chin Wang ◽  
...  
Keyword(s):  
Low Frequency ◽  
Frequency Noise ◽  
Low Frequency Noise ◽  
Metal Gate ◽  
High K ◽  
Technology Process ◽  
28 Nm
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