Low-Frequency Noise Assessment of the Oxide Trap Density in Thick-Oxide Input-Output Transistors for DRAM Applications

2016 ◽  
Vol 5 (6) ◽  
pp. N27-N31 ◽  
Author(s):  
E. Simoen ◽  
R. Ritzenthaler ◽  
M.-J. Cho ◽  
T. Schram ◽  
N. Horiguchi ◽  
...  
Keyword(s):  
Low Frequency ◽  
Trap Density ◽  
Frequency Noise ◽  
Low Frequency Noise ◽  
Input Output ◽  
Noise Assessment ◽  
Oxide Trap

Slow oxide trap density profile extraction using gate current low-frequency noise in ultrathin oxide MOSFETs

2007 ◽  
Vol 84 (9-10) ◽  
pp. 2382-2385 ◽  
Author(s):  
J. Armand ◽  
F. Martinez ◽  
M. Valenza ◽  
K. Rochereau ◽  
E. Vincent
Keyword(s):  
Density Profile ◽  
Low Frequency ◽  
Trap Density ◽  
Frequency Noise ◽  
Low Frequency Noise ◽  
Gate Current ◽  
Oxide Trap ◽  
Ultrathin Oxide

New numerical low frequency noise model for front and buried oxide trap density characterization in FDSOI MOSFETs

2011 ◽  
Vol 88 (7) ◽  
pp. 1286-1290 ◽  
Author(s):  
J. El Husseini ◽  
F. Martinez ◽  
J. Armand ◽  
M. Bawedin ◽  
M. Valenza ◽  
...  
Keyword(s):  
Low Frequency ◽  
Trap Density ◽  
Noise Model ◽  
Frequency Noise ◽  
Low Frequency Noise ◽  
Buried Oxide ◽  
Oxide Trap

On the Oxide Trap Density and Profiles of 1-nm EOT Metal-Gate Last CMOS Transistors Assessed by Low-Frequency Noise

2013 ◽  
Vol 60 (11) ◽  
pp. 3849-3855 ◽  
Author(s):  
Eddy Simoen ◽  
Anabela Veloso ◽  
Yuichi Higuchi ◽  
Naoto Horiguchi ◽  
Cor Claeys
Keyword(s):  
Low Frequency ◽  
Trap Density ◽  
Frequency Noise ◽  
Low Frequency Noise ◽  
Metal Gate ◽  
Cmos Transistors ◽  
Oxide Trap

scholarly journals Low-Frequency Noise Assessment of Work Function Engineering Cap Layers in High-k Gate Stacks

2019 ◽  
Vol 8 (2) ◽  
pp. N25-N31 ◽  
Author(s):  
C. Claeys ◽  
R. Ritzenthaler ◽  
T. Schram ◽  
H. Arimura ◽  
N. Horiguchi ◽  
...  
Keyword(s):  
Work Function ◽  
Low Frequency ◽  
Frequency Noise ◽  
Low Frequency Noise ◽  
Gate Stacks ◽  
High K ◽  
Noise Assessment

Low-Frequency Noise Assessment of Vertically Stacked Si n-Channel Nanosheet FETs With Different Metal Gates

2020 ◽  
Vol 67 (11) ◽  
pp. 4802-4807
Author(s):  
Alberto Oliveira ◽  
Anabela Veloso ◽  
Cor Claeys ◽  
Naoto Horiguchi ◽  
Eddy Simoen
Keyword(s):  
Low Frequency ◽  
Frequency Noise ◽  
Low Frequency Noise ◽  
Metal Gates ◽  
Noise Assessment
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