Deterministic Method to Evaluate the Threshold Voltage Variability Induced by Discrete Trap Charges in Si-Nanowire FETs
2012 ◽
Vol 59
(5)
◽
pp. 1462-1467
◽
2009 ◽
Vol 30
(3)
◽
pp. 243-245
◽
Keyword(s):
2017 ◽
Vol 64
(5)
◽
pp. 2113-2120
◽
Keyword(s):
Keyword(s):
Keyword(s):
2009 ◽
Vol E92-A
(4)
◽
pp. 990-997
2014 ◽
Vol 3
(2)
◽
pp. 33-39
Keyword(s):