Effect of Heat Diffusion During State Transitions in Resistive Switching Memory Device Based on Nickel-Rich Nickel Oxide Film
2012 ◽
Vol 59
(5)
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pp. 1558-1562
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2012 ◽
Vol 22
(34)
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pp. 17568
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2017 ◽
Vol 5
(37)
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pp. 9799-9805
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Keyword(s):
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2015 ◽
Vol 54
(2)
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pp. 021802
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2012 ◽
Vol 51
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pp. 101101
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2012 ◽
Vol 51
(10R)
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pp. 101101
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Keyword(s):
2014 ◽
Vol 61
(4)
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pp. 1071-1076
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Keyword(s):