Erratum to “Degradation Analysis of 2 $\mu$m DFB Laser Using Optical Beam Induced Current Technique” [Oct 07 2644-2649]

2008 ◽  
Vol 55 (2) ◽  
pp. 701-701
Author(s):  
Tatsuya Takeshita ◽  
Tomonari Sato ◽  
Manabu Mitsuhara ◽  
Yasuhiro Kondo ◽  
Mitsuru Sugo ◽  
...  
Keyword(s):  
Optical Beam ◽  
Induced Current ◽  
Current Technique ◽  
Degradation Analysis ◽  
Dfb Laser ◽  
Optical Beam Induced Current

Degradation Analysis of 2-$\mu\hbox{m}$ DFB Laser Using Optical Beam-Induced Current Technique

2007 ◽  
Vol 54 (10) ◽  
pp. 2644-2649 ◽  
Author(s):  
Tatsuya Takeshita ◽  
Tomonari Sato ◽  
Manabu Mitsuhara ◽  
Yasuhiro Kondo ◽  
Mitsuru Sugo ◽  
...  
Keyword(s):  
Optical Beam ◽  
Induced Current ◽  
Current Technique ◽  
Degradation Analysis ◽  
Dfb Laser ◽  
Optical Beam Induced Current

Detection of defects in metal interconnects by the nonbias-optical beam induced current technique

1999 ◽  
Vol 86 (11) ◽  
pp. 5949-5956 ◽  
Author(s):  
Tohru Koyama ◽  
Kenichiro Sonoda ◽  
Junko Komori ◽  
Yoji Mashiko ◽  
Masataka Umeno
Keyword(s):  
Optical Beam ◽  
Induced Current ◽  
Current Technique ◽  
Metal Interconnects ◽  
Optical Beam Induced Current ◽  
Detection Of Defects

Analysis of Wear-Out Degradation of a DFB Laser Using an Optical-Beam-Induced Current Monitor

2007 ◽  
Vol 54 (8) ◽  
pp. 1852-1859 ◽  
Author(s):  
T. Takeshita ◽  
M. Yamamoto ◽  
R. Iga ◽  
M. Sugo ◽  
Y. Kondo ◽  
...  
Keyword(s):  
Optical Beam ◽  
Induced Current ◽  
Dfb Laser ◽  
Optical Beam Induced Current

Evaluation of Silicide Morphology by Near-Infrared-Laser Optical-Beam-Induced-Current Technique

2001 ◽  
Vol 40 (Part 1, No. 11) ◽  
pp. 6446-6452 ◽  
Author(s):  
Tohru Koyama ◽  
Masataka Umeno ◽  
Junko Komori ◽  
Yoji Mashiko
Keyword(s):  
Near Infrared ◽  
Infrared Laser ◽  
Optical Beam ◽  
Induced Current ◽  
Current Technique ◽  
Optical Beam Induced Current
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