Characterization of an Amorphous$hbox Ge_xhbox Si_1-xhbox O_y$Microbolometer for Thermal Imaging Applications

2005 ◽  
Vol 52 (8) ◽  
pp. 1900-1906 ◽  
Author(s):  
A.H.Z. Ahmed ◽  
R.N. Tait
Keyword(s):  
Author(s):  
James Tomaszewski ◽  
Richard Branam ◽  
William Hargus ◽  
Taylor Matlock

2007 ◽  
Vol 34 (7) ◽  
pp. 3102-3108 ◽  
Author(s):  
Andrew M. Elliott ◽  
R. Jason Stafford ◽  
Jon Schwartz ◽  
James Wang ◽  
Anil M. Shetty ◽  
...  

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