Monte Carlo study of remote Coulomb and remote surface roughness scattering in nanoscale Ge PMOSFETs with ultrathin high-k dielectrics
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2006 ◽
Vol 50
(2)
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pp. 248-253
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2003 ◽
Vol 2
(2)
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pp. 110-114
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2017 ◽
Vol 414
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pp. 361-364
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Keyword(s):
2003 ◽
Vol 2
(2-4)
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pp. 163-167
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