A Static Trigger Wear-Leveling Strategy for Flash Memory In Embedded System

2008 ◽  
Author(s):  
Song-He Liu ◽  
Xiang-Mo Zhao ◽  
Jun Zhang ◽  
Ya-Nan Huang
Keyword(s):  
Embedded System ◽  
Flash Memory ◽  
Wear Leveling

scholarly journals A Block Classification Method with Monitor and Restriction in NAND Flash memory

2021 ◽  
Vol 12 (5) ◽  
pp. 209-215
Author(s):  
Myungsub Lee
Keyword(s):  
Performance Evaluation ◽  
Standard Deviation ◽  
Flash Memory ◽  
Garbage Collection ◽  
Memory Systems ◽  
Nand Flash ◽  
Nand Flash Memory ◽  
Wear Leveling ◽  
Block Classification ◽  
Update Frequency

In this paper, we propose a block classification with monitor and restriction (BCMR) method to isolate and reduce the interference of blocks in garbage collection and wear leveling. The proposed method monitors the endurance variation of blocks during garbage collection and detects hot blocks by making a restriction condition based on this information. This method induces block classification by its update frequency for garbage collection and wear leveling, resulting in a prolonged lifespan for NAND flash memory systems. The performance evaluation results show that the BCMR method prolonged the life of NAND flash memory systems by 3.95% and reduced the standard deviation per block by 7.4%, on average.

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