Advantages of in-situ RTP for the fabrication of metal/high-dielectric constant gate dielectric stack for sub 90 nm CMOS technology

Author(s):  
D. Damjanovic ◽  
K.F. Poole ◽  
R. Singh
1986 ◽  
Vol 71 ◽  
Author(s):  
R. Singh

AbstractCurrent trends are in the direction of submicron MOSFETs employing gate dielectrics in the thickness range of about 30 - 100A°. The performance and reliability of submicron MOSFETs can be improved by using high dielectric constant gate dielectric material. A new concept involving 2 or more dielectric material is proposed in this paper. In- situ rapid isothermal processing is proposed for the fabrication of thin gate dielectrics.


2016 ◽  
Vol 2016 ◽  
pp. 1-6 ◽  
Author(s):  
Khalil Ahmed ◽  
Farah Kanwal ◽  
Shahid M. Ramay ◽  
Asif Mahmood ◽  
Shahid Atiq ◽  
...  

TiO2/polypyrrole composites with high dielectric constant have been synthesized byin situpolymerization of pyrrole in an aqueous dispersion of low concentration of TiO2, in the presence of small amount of HCl. Structural, optical, surface morphological, and thermal properties of the composites were investigated by X-ray diffractometer, Fourier transform infrared spectroscopy, field-emission scanning electron microscopy, and thermogravimetric analysis, respectively. The data obtained from diffractometer and thermal gravimetric analysis confirmed the crystalline nature and thermal stability of the prepared composites. The dielectric constant of 5 wt% TiO2increased with filler content up to 4.3 × 103at 1 kHz and then decreased to 1.25 × 103at 10 kHz.


2019 ◽  
Vol 2 (3) ◽  
pp. 97-102 ◽  
Author(s):  
Yi Chen ◽  
Zhen Kong ◽  
Wenqi Chen ◽  
Lv Xiao ◽  
Yong Yuan ◽  
...  

RSC Advances ◽  
2018 ◽  
Vol 8 (68) ◽  
pp. 39115-39119 ◽  
Author(s):  
Jong-Baek Seon ◽  
Nam-Kwang Cho ◽  
Gayeong Yoo ◽  
Youn Sang Kim ◽  
Kookheon Char

Solution-processed amorphous zirconium oxide (ZrO2) dielectrics were formed via a non-hydrolytic sol–gel route at low-temperature. The ZrO2 films exhibited a high dielectric constant and high mobility p-type pentacene TFTs were fabricated using them.


2006 ◽  
Vol 89 (18) ◽  
pp. 183516 ◽  
Author(s):  
Se Hyun Kim ◽  
Sang Yoon Yang ◽  
Kwonwoo Shin ◽  
Hayoung Jeon ◽  
Jong Won Lee ◽  
...  

2006 ◽  
Vol 966 ◽  
Author(s):  
C.Y. Liu ◽  
Tseung-Yuen Tseng

ABSTRACTAmong various possible candidates of high-k gate dielectrics, SrTiO3 plays an important role because it has high dielectric constant and it can be epitaxially grown on silicon substrate. The fabrication process and properties of SrTiO3 gate dielectrics are reported. The effect of the addition of SiO2 on the microstructure and electrical properties of SrTiO3 gate dielectric is also presented. The minimization of the effect of interfacial layer between SrTiO3 and Si is the most important issue for obtaining high quality high-k gate dielectrics. The possible methods to improve the interfacial properties and the measurement techniques to characterize the interfacial layer are discussed.


2013 ◽  
Vol 270 ◽  
pp. 319-323 ◽  
Author(s):  
Meiling Yuan ◽  
Wei Zhang ◽  
Xianyang Wang ◽  
Wei Pan ◽  
Li Wang ◽  
...  

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