High-Resolution Characterization of Ultra-Shallow Junctions by Scanning Spreading Resistance Microscopy

Author(s):  
Li Zhang ◽  
Kanna Adachi ◽  
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Akira Nishiyama
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Vol 208-209 ◽  
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pp. 192103 ◽  
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L. Zhang ◽  
K. Ohuchi ◽  
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pp. 102-109 ◽  
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