The Impact of Inner Pickup on ESD Robustness of Multi-Finger NMOS in Nanoscale CMOS Technology
2015 ◽
Vol 24
(04)
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pp. 1550052
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Keyword(s):
Keyword(s):
2019 ◽
Vol 28
(07)
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pp. 1950110
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2005 ◽
Vol 40
(11)
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pp. 2329-2338
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High robust and cost effective double node upset tolerant latch design for nanoscale CMOS technology
2019 ◽
Vol 93
◽
pp. 89-97
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Keyword(s):