Degradation of tunnel oxide by FN current stress and its effects on data retention characteristics of 90 nm NAND flash memory cells

2003 ◽  
Author(s):  
Jae-Duk Lee ◽  
Jeong-Hyuk Choi ◽  
Donggun Park ◽  
Kinam Kim
Keyword(s):  
Flash Memory ◽  
Memory Cells ◽  
Nand Flash ◽  
Nand Flash Memory ◽  
Data Retention ◽  
Current Stress ◽  
Retention Characteristics

The Effect of Trapped Charge Distributions on Data Retention Characteristics of nand Flash Memory Cells

2007 ◽  
Vol 28 (8) ◽  
pp. 750-752 ◽  
Author(s):  
M. Park ◽  
Kangdeog Suh ◽  
Keonsoo Kim ◽  
S. Hur ◽  
K. Kim ◽  
...  
Keyword(s):  
Flash Memory ◽  
Memory Cells ◽  
Nand Flash ◽  
Nand Flash Memory ◽  
Data Retention ◽  
Charge Distributions ◽  
Retention Characteristics ◽  
Trapped Charge

Data retention characteristics of sub-100 nm NAND flash memory cells

2003 ◽  
Vol 24 (12) ◽  
pp. 748-750 ◽  
Author(s):  
Jae-Duk Lee ◽  
Jeong-Hyuk Choi ◽  
Donggun Park ◽  
Kinam Kim
Keyword(s):  
Flash Memory ◽  
Memory Cells ◽  
Nand Flash ◽  
Nand Flash Memory ◽  
Data Retention ◽  
Retention Characteristics

The Effect of Negative $V_{\rm TH}$ of nand Flash Memory Cells on Data Retention Characteristics

2009 ◽  
Vol 30 (2) ◽  
pp. 155-157 ◽  
Author(s):  
M. Park ◽  
Eungjin Ahn ◽  
Eunsuk Cho ◽  
Keonsoo Kim ◽  
Won-Seong Lee
Keyword(s):  
Flash Memory ◽  
Memory Cells ◽  
Nand Flash ◽  
Nand Flash Memory ◽  
Data Retention ◽  
Retention Characteristics
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