High-current transmission line pulse characterization of aluminum and copper interconnects for advanced CMOS semiconductor technologies

Author(s):  
S. Voldman ◽  
R. Gauthier ◽  
D. Reinhart ◽  
K. Morrisseau
2002 ◽  
Vol 85 (3) ◽  
pp. 16-22
Author(s):  
Kiichi Kamimura ◽  
Shinsuke Okada ◽  
Masato Nakao ◽  
Yoshiharu Onuma ◽  
Shozo Yamashita

2021 ◽  
Vol 31 (4) ◽  
pp. 417-420
Author(s):  
Tommaso Cappello ◽  
Zoya Popovic ◽  
Kevin Morris ◽  
Angelo Cappello

Sign in / Sign up

Export Citation Format

Share Document