High-current transmission line pulse characterization of aluminum and copper interconnects for advanced CMOS semiconductor technologies
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2003 ◽
Vol 43
(7)
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pp. 1039-1045
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Characterization of contact resistance of low-value resistor by transmission line model (TLM) method
2002 ◽
Vol 85
(3)
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pp. 16-22
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2005 ◽
Vol 251
(1-4)
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pp. 249-253
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