Effectiveness of yield-estimation and reliability-prediction based on wafer test-chip measurements

2002 ◽  
Author(s):  
C.K. Hansen
Keyword(s):  
Reliability Prediction ◽  
Yield Estimation ◽  
Test Chip ◽  
Wafer Test

Automated cell counting of astrocytes on patterned substrates containing aliphatic and charged properties

1995 ◽  
Vol 53 ◽  
pp. 974-975
Author(s):  
W. Shain ◽  
H. Ancin ◽  
H.C. Craighead ◽  
M. Isaacson ◽  
L. Kam ◽  
...  
Keyword(s):  
Cell Culture ◽  
Cell Attachment ◽  
Culture Method ◽  
Cell Counting ◽  
Data Sets ◽  
Nuclear Staining ◽  
Double Positive ◽  
A Cell ◽  
Wafer Test ◽  
Cell Densities

Neural protheses have potential to restore nervous system functions lost by trauma or disease. Nanofabrication extends this approach to implants for stimulating and recording from single or small groups of neurons in the spinal cord and brain; however, tissue compatibility is a major limitation to their practical application. We are using a cell culture method for quantitatively measuring cell attachment to surfaces designed for nanofabricated neural prostheses.Silicon wafer test surfaces composed of 50-μm bars separated by aliphatic regions were fabricated using methods similar to a procedure described by Kleinfeld et al. Test surfaces contained either a single or double positive charge/residue. Cyanine dyes (diIC18(3)) stained the background and cell membranes (Fig 1); however, identification of individual cells at higher densities was difficult (Fig 2). Nuclear staining with acriflavine allowed discrimination of individual cells and permitted automated counting of nuclei using 3-D data sets from the confocal microscope (Fig 3). For cell attachment assays, LRM5 5 astroglial cells and astrocytes in primary cell culture were plated at increasing cell densities on test substrates, incubated for 24 hr, fixed, stained, mounted on coverslips, and imaged with a 10x objective.

Reliability Prediction Based on Field Failure Data of Guided Missile

2018 ◽  
Vol 18 (3) ◽  
pp. 250-259 ◽  
Author(s):  
Yangwoo Seo ◽  
Kyeshin Lee ◽  
Younho Lee ◽  
Jeyong Kim
Keyword(s):  
Reliability Prediction ◽  
Failure Data ◽  
Field Failure

Evaluation of alternative methods to calculate evapotranspiration and their impact on soybean yield estimation

Agrometeoros ◽  
2020 ◽  
Vol 28 ◽  
Author(s):  
Rodrigo Cornacini Ferreira ◽  
Otávio Jorge Grigoli Abi-Saab ◽  
Marcelo Augusto de Aguiar e Silva ◽  
Rubson Natal Ribeiro Sibaldellib ◽  
José Renato Bouças Farias
Keyword(s):  
Alternative Methods ◽  
Yield Estimation ◽  
Soybean Yield

Using neural networks in reliability prediction

IEEE Software ◽  
1992 ◽  
Vol 9 (4) ◽  
pp. 53-59 ◽  
Author(s):  
N. Karunanithi ◽  
D. Whitley ◽  
Y.K. Malaiya
Keyword(s):  
Neural Networks ◽  
Reliability Prediction
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