Thermal noise in field-effect transistors

F.N. Trofimenkoff

doi:10.1109/proc.1966.4882

Thermal noise in field-effect transistors

Proceedings of the IEEE ◽

10.1109/proc.1966.4882 ◽

1966 ◽

Vol 54 (5) ◽

pp. 817-817

Author(s):

F.N. Trofimenkoff

Keyword(s):

Field Effect ◽

Thermal Noise ◽

Field Effect Transistors

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On the influence of hot carrier effects on the thermal noise of field-effect transistors

IEEE Transactions on Electron Devices ◽

10.1109/t-ed.1970.17087 ◽

1970 ◽

Vol 17 (10) ◽

pp. 858-862 ◽

Cited By ~ 29

Author(s):

F.M. Klaassen

Keyword(s):

Field Effect ◽

Thermal Noise ◽

Field Effect Transistors ◽

Hot Carrier ◽

Hot Carrier Effects

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Effect of the bulk charge on the thermal noise in metal-oxide-silicon field-effect transistors

IEEE Transactions on Electron Devices ◽

10.1109/t-ed.1965.15594 ◽

1965 ◽

Vol 12 (9) ◽

pp. 509-509

Author(s):

C.T. Sah ◽

F.H. Hielscher ◽

S.Y. Wu

Keyword(s):

Metal Oxide ◽

Field Effect ◽

Thermal Noise ◽

Field Effect Transistors ◽

Bulk Charge ◽

Metal Oxide Silicon

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Thermal-noise suppression in nano-scale Si field-effect transistors by feedback control based on single-electron detection

Applied Physics Letters ◽

10.1063/1.4928656 ◽

2015 ◽

Vol 107 (7) ◽

pp. 073110 ◽

Cited By ~ 17

Author(s):

Kensaku Chida ◽

Katsuhiko Nishiguchi ◽

Gento Yamahata ◽

Hirotaka Tanaka ◽

Akira Fujiwara

Keyword(s):

Feedback Control ◽

Field Effect ◽

Thermal Noise ◽

Noise Suppression ◽

Field Effect Transistors ◽

Single Electron ◽

Nano Scale ◽

Electron Detection

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Hot-electron effects on channel thermal noise in fine-line NMOS field-effect transistors

IEEE Transactions on Electron Devices ◽

10.1109/t-ed.1986.22680 ◽

1986 ◽

Vol 33 (9) ◽

pp. 1395-1397 ◽

Cited By ~ 54

Author(s):

R.P. Jindal

Keyword(s):

Field Effect ◽

Thermal Noise ◽

Field Effect Transistors ◽

Hot Electron ◽

Fine Line ◽

Electron Effects

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