A GA-Based Method for High-Quality X-Filling to Reduce Launch Switching Activity in At-speed Scan Testing

2009 ◽  
Author(s):  
Yuta Yamato ◽  
Xiaoqing Wen ◽  
Kohei Miyase ◽  
Hiroshi Furukawa ◽  
Seiji Kajihara
Keyword(s):  
Switching Activity ◽  
High Quality ◽  
Scan Testing

scholarly journals High Launch Switching Activity Reduction in At-Speed Scan Testing Using CTX: A Clock-Gating-Based Test Relaxation and X-Filling Scheme

2010 ◽  
Vol E93-D (1) ◽  
pp. 2-9
Author(s):  
Kohei MIYASE ◽  
Xiaoqing WEN ◽  
Hiroshi FURUKAWA ◽  
Yuta YAMATO ◽  
Seiji KAJIHARA ◽  
...  
Keyword(s):  
Switching Activity ◽  
Clock Gating ◽  
Scan Testing ◽  
Switching Activity Reduction

scholarly journals A GA-Based X-Filling for Reducing Launch Switching Activity toward Specific Objectives in At-Speed Scan Testing

2011 ◽  
Vol E94-D (4) ◽  
pp. 833-840
Author(s):  
Yuta YAMATO ◽  
Xiaoqing WEN ◽  
Kohei MIYASE ◽  
Hiroshi FURUKAWA ◽  
Seiji KAJIHARA
Keyword(s):  
Switching Activity ◽  
Scan Testing

A novel scheme to reduce power supply noise for high-quality at-speed scan testing

2007 ◽  
Author(s):  
Xiaoqing Wen ◽  
Kohei Miyase ◽  
Seiji Kajihara ◽  
Tatsuya Suzuki ◽  
Yuta Yamato ◽  
...  
Keyword(s):  
Power Supply ◽  
Power Supply Noise ◽  
High Quality ◽  
Scan Testing ◽  
Supply Noise

Utilizing Delta IDDQ to Screen Cell Specific Defects for High Quality and Reliability Applications

2019 ◽  
Author(s):  
Eric Barbian ◽  
Niel Sanico ◽  
Julien Thiefain ◽  
Andy Koestner
Keyword(s):  
Test Time ◽  
High Grade ◽  
High Quality ◽  
Scan Testing ◽  
Input Condition ◽  
Specific Input ◽  
A Cell ◽  
Quality And Reliability ◽  
Commercial Applications ◽  
Time Overhead

Abstract High quality and reliability are paramount for automotive and other high grade commercial applications. The implementation of scan testing including stuck-at, transition, IDDQ, bridging and cell-aware patterns have all been targeted at reducing the number of defective parts being shipped. These techniques are not always sufficient to achieve sub defective parts per million (DPPM) quality levels. This paper presents a recurring failure mechanism that was encountered on an automotive device and the subsequent efforts to expand upon existing testing methodologies to effectively screen the defective devices using a delta IDDQ method with specific logic inputs and outputs. In effect, this new testing becomes a cell-aware delta IDDQ targeting one specific input condition that was implemented in production with limited test time overhead.

Low Capture Switching Activity Test Generation for Reducing IR-Drop in At-Speed Scan Testing

2008 ◽  
Vol 24 (4) ◽  
pp. 379-391 ◽  
Author(s):  
Xiaoqing Wen ◽  
Kohei Miyase ◽  
Tatsuya Suzuki ◽  
Seiji Kajihara ◽  
Laung-Terng Wang ◽  
...  
Keyword(s):  
Test Generation ◽  
Switching Activity ◽  
Scan Testing ◽  
Ir Drop ◽  
Activity Test

Some problems of objective-prism spectra classification

1966 ◽  
Vol 24 ◽  
pp. 51-52
Author(s):  
E. K. Kharadze ◽  
R. A. Bartaya
Keyword(s):  
Short Wave ◽  
High Quality ◽  
Stellar Spectra ◽  
Objective Prism

The unique 70-cm meniscus-type telescope of the Abastumani Astrophysical Observatory supplied with two objective prisms and the seeing conditions characteristic at Mount Kanobili (Abastumani) permit us to obtain stellar spectra of a high quality. No additional design to improve the “climate” immediately around the telescope itself is being applied. The dispersions and photographic magnitude limits are 160 and 660Å/mm, and 12–13, respectively. The short-wave end of spectra reaches 3500–3400Å.

A non-cyanide method of electropolishing silver

1978 ◽  
Vol 36 (1) ◽  
pp. 146-147
Author(s):  
R. L. Lyles ◽  
S. J. Rothman ◽  
W. Jäger
Keyword(s):  
Electron Microscopy ◽  
Sulphuric Acid ◽  
Methyl Alcohol ◽  
Health Hazards ◽  
Silver Alloy ◽  
High Quality ◽  
Silver Alloys ◽  
Free Sample ◽  
Specimen Quality ◽  
Standard Techniques

Standard techniques of electropolishing silver and silver alloys for electron microscopy in most instances have relied on various CN recipes. These methods have been characteristically unsatisfactory due to difficulties in obtaining large electron transparent areas, reproducible results, adequate solution lifetimes, and contamination free sample surfaces. In addition, there are the inherent health hazards associated with the use of CN solutions. Various attempts to develop noncyanic methods of electropolishing specimens for electron microscopy have not been successful in that the specimen quality problems encountered with the CN solutions have also existed in the previously proposed non-cyanic methods.The technique we describe allows us to jet polish high quality silver and silver alloy microscope specimens with consistant reproducibility and without the use of CN salts.The solution is similar to that suggested by Myschoyaev et al. It consists, in order of mixing, 115ml glacial actic acid (CH3CO2H, specific wt 1.04 g/ml), 43ml sulphuric acid (H2SO4, specific wt. g/ml), 350 ml anhydrous methyl alcohol, and 77 g thiourea (NH2CSNH2).

A High Resolution Scanning Microscope

1968 ◽  
Vol 26 ◽  
pp. 356-357
Author(s):  
A. V. Crewe ◽  
J. Wall ◽  
L. M. Welter
Keyword(s):  
High Resolution ◽  
Field Emission ◽  
Spherical Aberration ◽  
Focal Length ◽  
Spot Size ◽  
Emission Source ◽  
Field Of View ◽  
Scanning Microscope ◽  
Magnetic Lens ◽  
High Quality

A scanning microscope using a field emission source has been described elsewhere. This microscope has now been improved by replacing the single magnetic lens with a high quality lens of the type described by Ruska. This lens has a focal length of 1 mm and a spherical aberration coefficient of 0.5 mm. The final spot size, and therefore the microscope resolution, is limited by the aberration of this lens to about 6 Å.The lens has been constructed very carefully, maintaining a tolerance of + 1 μ on all critical surfaces. The gun is prealigned on the lens to form a compact unit. The only mechanical adjustments are those which control the specimen and the tip positions. The microscope can be used in two modes. With the lens off and the gun focused on the specimen, the resolution is 250 Å over an undistorted field of view of 2 mm. With the lens on,the resolution is 20 Å or better over a field of view of 40 microns. The magnification can be accurately varied by attenuating the raster current.

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