Total-Ionizing-Dose Irradiation-Induced Dielectric Field Enhancement for High-Voltage SOI LDMOS

2019 ◽  
Vol 40 (4) ◽  
pp. 593-596 ◽  
Author(s):  
Xin Zhou ◽  
Zhangyi'an Yuan ◽  
Lei Shu ◽  
Ming Qiao ◽  
Zhenlin Lu ◽  
...  
Keyword(s):  
High Voltage ◽  
Field Enhancement ◽  
Total Ionizing Dose ◽  
Dose Irradiation

Effects of Total-Ionizing-Dose Irradiation on Single-Event Response for Flip-Flop Designs at a 14-/16-nm Bulk FinFET Technology Node

2018 ◽  
Vol 65 (8) ◽  
pp. 1928-1934 ◽  
Author(s):  
H. Zhang ◽  
H. Jiang ◽  
X. Fan ◽  
J. S. Kauppila ◽  
I. Chatterjee ◽  
...  
Keyword(s):  
Single Event ◽  
Total Ionizing Dose ◽  
Flip Flop ◽  
Technology Node ◽  
Dose Irradiation ◽  
Event Response

Effects of Total-Ionizing-Dose Irradiation on SEU- and SET-Induced Soft Errors in Bulk 40-nm Sequential Circuits

2017 ◽  
Vol 64 (1) ◽  
pp. 471-476 ◽  
Author(s):  
R. M. Chen ◽  
Z. J. Diggins ◽  
N. N. Mahatme ◽  
L. Wang ◽  
E. X. Zhang ◽  
...  
Keyword(s):  
Soft Errors ◽  
Sequential Circuits ◽  
Total Ionizing Dose ◽  
Dose Irradiation

Total ionizing dose effects in high voltage devices for flash memory

2010 ◽  
Vol 268 (23) ◽  
pp. 3498-3503 ◽  
Author(s):  
Zhangli Liu ◽  
Zhiyuan Hu ◽  
Zhengxuan Zhang ◽  
Hua Shao ◽  
Ming Chen ◽  
...  
Keyword(s):  
High Voltage ◽  
Flash Memory ◽  
Total Ionizing Dose ◽  
Dose Effects ◽  
Total Ionizing Dose Effects

scholarly journals Research on SRAM functional failure mode induced by total ionizing dose irradiation

2013 ◽  
Vol 62 (11) ◽  
pp. 116101
Author(s):  
Zheng Qi-Wen ◽  
Yu Xue-Feng ◽  
Cui Jiang-Wei ◽  
Guo Qi ◽  
Ren Di-Yuan ◽  
...  
Keyword(s):  
Failure Mode ◽  
Total Ionizing Dose ◽  
Functional Failure ◽  
Dose Irradiation
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