Voltage Ramp Stress for Hot-Carrier Screening of Scaled CMOS Devices
2012 ◽
Vol 33
(6)
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pp. 749-751
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2016 ◽
Vol 29
(6)
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pp. 065601
1991 ◽
Vol 31
(5)
◽
pp. 519-534
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Keyword(s):
Keyword(s):
1993 ◽
Vol 140
(6)
◽
pp. 431
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Keyword(s):