Voltage Ramp Stress for Hot-Carrier Screening of Scaled CMOS Devices

2012 ◽  
Vol 33 (6) ◽  
pp. 749-751 ◽  
Author(s):  
A. Kerber ◽  
W. McMahon ◽  
E. Cartier
1991 ◽  
Vol 31 (5) ◽  
pp. 519-534 ◽  
Author(s):  
K. Morawetz ◽  
K. Kilimann ◽  
D. Kremp

1989 ◽  
Vol 39 (12) ◽  
pp. 8464-8467 ◽  
Author(s):  
Ben Yu-Kuang Hu ◽  
John W. Wilkins

1989 ◽  
Vol 39 (12) ◽  
pp. 8468-8475 ◽  
Author(s):  
Ben Yu-Kuang Hu ◽  
Sanjoy K. Sarker ◽  
John W. Wilkins

1990 ◽  
Vol 41 (15) ◽  
pp. 10706-10720 ◽  
Author(s):  
Ben Yu-Kuang Hu ◽  
John W. Wilkins

2008 ◽  
Vol 38 (5) ◽  
pp. 58
Author(s):  
GREG FEERO
Keyword(s):  

1981 ◽  
Vol 42 (C7) ◽  
pp. C7-51-C7-56
Author(s):  
K. Aoki ◽  
T. Kobayashi ◽  
K. Yamamoto

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