Universal features in degenerate and nondegenerate hot-carrier screening

1990 ◽  
Vol 41 (15) ◽  
pp. 10706-10720 ◽  
Author(s):  
Ben Yu-Kuang Hu ◽  
John W. Wilkins
Keyword(s):  
Carrier Screening ◽  
Hot Carrier

Kinetic Theory of Hot Carrier Screening

1991 ◽  
Vol 31 (5) ◽  
pp. 519-534 ◽  
Author(s):  
K. Morawetz ◽  
K. Kilimann ◽  
D. Kremp
Keyword(s):  
Kinetic Theory ◽  
Carrier Screening ◽  
Hot Carrier

Hot-carrier screening in semiconductors: A Boltzmann-equation approach

1989 ◽  
Vol 39 (12) ◽  
pp. 8464-8467 ◽  
Author(s):  
Ben Yu-Kuang Hu ◽  
John W. Wilkins
Keyword(s):  
Boltzmann Equation ◽  
Carrier Screening ◽  
Equation Approach ◽  
Hot Carrier

Quantum kinetic-equation approach to semiconductor hot-carrier screening

1989 ◽  
Vol 39 (12) ◽  
pp. 8468-8475 ◽  
Author(s):  
Ben Yu-Kuang Hu ◽  
Sanjoy K. Sarker ◽  
John W. Wilkins
Keyword(s):  
Kinetic Equation ◽  
Carrier Screening ◽  
Equation Approach ◽  
Quantum Kinetic Equation ◽  
Hot Carrier

Voltage Ramp Stress for Hot-Carrier Screening of Scaled CMOS Devices

2012 ◽  
Vol 33 (6) ◽  
pp. 749-751 ◽  
Author(s):  
A. Kerber ◽  
W. McMahon ◽  
E. Cartier
Keyword(s):  
Carrier Screening ◽  
Hot Carrier ◽  
Voltage Ramp ◽  
Scaled Cmos

What Should We Do With Carrier Screening?

2008 ◽  
Vol 38 (5) ◽  
pp. 58
Author(s):  
GREG FEERO
Keyword(s):  
Carrier Screening

PERIODIC OSCILLATIONS AND TURBULENCE OF HOT-CARRIER PLASMA AT 4.2 K IN n-GaAs

1981 ◽  
Vol 42 (C7) ◽  
pp. C7-51-C7-56
Author(s):  
K. Aoki ◽  
T. Kobayashi ◽  
K. Yamamoto
Keyword(s):  
Periodic Oscillations ◽  
Hot Carrier

HOT CARRIER STRESS INDUCED CHANGES IN MOST TRANSCONDUCTANCE STRUCTURE

1988 ◽  
Vol 49 (C4) ◽  
pp. C4-779-C4-782 ◽  
Author(s):  
C. BERGONZONI ◽  
R. BENECCHI ◽  
P. CAPRARA
Keyword(s):  
Hot Carrier ◽  
Hot Carrier Stress ◽  
Induced Changes

ANALYSIS OF HOT CARRIER DEGRADATION IN AC STRESSED N-CHANNEL MOS TRANSISTORS USING THE CHARGE PUMPING TECHNIQUE

1988 ◽  
Vol 49 (C4) ◽  
pp. C4-651-C4-655 ◽  
Author(s):  
R. BELLENS ◽  
P. HEREMANS ◽  
G. GROESENEKEN ◽  
H. E. MAES
Keyword(s):  
Mos Transistors ◽  
Charge Pumping ◽  
Hot Carrier ◽  
Hot Carrier Degradation
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