An Analytical Expression for Threshold Voltage of Polycrystalline-Silicon Thin-Film Transistors

2010 ◽  
Vol 31 (8) ◽  
pp. 815-817 ◽  
Author(s):  
Yan Zhou ◽  
Mingxiang Wang ◽  
Dapeng Zhou ◽  
Dongli Zhang ◽  
Man Wong
Keyword(s):  
Thin Film ◽  
Threshold Voltage ◽  
Thin Film Transistors ◽  
Polycrystalline Silicon ◽  
Silicon Thin Film ◽  
Analytical Expression

Threshold voltage of excimer-laser-annealed polycrystalline silicon thin-film transistors

2000 ◽  
Vol 76 (17) ◽  
pp. 2442-2444 ◽  
Author(s):  
C. T. Angelis ◽  
C. A. Dimitriadis ◽  
F. V. Farmakis ◽  
J. Brini ◽  
G. Kamarinos ◽  
...  
Keyword(s):  
Thin Film ◽  
Excimer Laser ◽  
Threshold Voltage ◽  
Thin Film Transistors ◽  
Polycrystalline Silicon ◽  
Silicon Thin Film

Analysis of threshold voltage of short channel polycrystalline silicon thin-film transistors fabricated on large grains

2006 ◽  
Vol 100 (11) ◽  
pp. 114507 ◽  
Author(s):  
Genshiro Kawachi ◽  
Shinzo Tsuboi ◽  
Takashi Okada ◽  
Masahiro Mitani ◽  
Masakiyo Matsumura
Keyword(s):  
Thin Film ◽  
Threshold Voltage ◽  
Thin Film Transistors ◽  
Polycrystalline Silicon ◽  
Silicon Thin Film ◽  
Short Channel

Polarity Change of Threshold Voltage Shifts for n-channel Polycrystalline Silicon Thin-Film Transistors Stressed by Negative Gate Bias

2019 ◽  
Vol 16 (10) ◽  
pp. 163-167 ◽  
Author(s):  
Ching-Fang Huang ◽  
Ying-Jhe Yang ◽  
Cheng-Yi Peng ◽  
Hung-Chang Sun ◽  
Chee Wee Liu ◽  
...  
Keyword(s):  
Thin Film ◽  
Threshold Voltage ◽  
Thin Film Transistors ◽  
Polycrystalline Silicon ◽  
Gate Bias ◽  
Silicon Thin Film ◽  
Polarity Change
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