Effects of oxygen‐reduction treatments on the threshold voltage and low‐frequency noise of MOS transistors

1974 ◽  
Vol 24 (1) ◽  
pp. 27-29 ◽  
Author(s):  
F. H. Hielscher ◽  
J. H. End
2009 ◽  
Author(s):  
O. Marinov ◽  
M. J. Deen ◽  
Massimo Macucci ◽  
Giovanni Basso

1991 ◽  
Vol 38 (2) ◽  
pp. 323-327 ◽  
Author(s):  
T. Elewa ◽  
B. Boukriss ◽  
H.S. Haddara ◽  
A. Chovet ◽  
S. Cristoloveanu

1968 ◽  
Vol 11 (9) ◽  
pp. 797-812 ◽  
Author(s):  
S. Christensson ◽  
I. Lundström ◽  
C. Svensson

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