Oxide reliability of drain engineered I/O NMOS from hot carrier injection

Yuhao Luo; D. Nayak; D. Gitlin;  Ming-Yin Hao;  Chia-Hung Kao;  Chien-Hsun Wang

doi:10.1109/led.2003.818890

Oxide reliability of drain engineered I/O NMOS from hot carrier injection

IEEE Electron Device Letters ◽

10.1109/led.2003.818890 ◽

2003 ◽

Vol 24 (11) ◽

pp. 686-688 ◽

Cited By ~ 17

Author(s):

Yuhao Luo ◽

D. Nayak ◽

D. Gitlin ◽

Ming-Yin Hao ◽

Chia-Hung Kao ◽

...

Keyword(s):

Carrier Injection ◽

Hot Carrier ◽

Hot Carrier Injection ◽

Oxide Reliability

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Plasma-damaged oxide reliability study correlating both hot-carrier injection and time-dependent dielectric breakdown

IEEE Electron Device Letters ◽

10.1109/55.215118 ◽

1993 ◽

Vol 14 (2) ◽

pp. 91-93 ◽

Cited By ~ 27

Author(s):

X. Li ◽

J.-T. Hsu ◽

P. Aum ◽

D. Chan ◽

J. Rembetski ◽

...

Keyword(s):

Dielectric Breakdown ◽

Time Dependent ◽

Carrier Injection ◽

Reliability Study ◽

Hot Carrier ◽

Time Dependent Dielectric Breakdown ◽

Hot Carrier Injection ◽

Oxide Reliability

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Analysis of Hot Carrier Injection According to Gate Length

Journal of Nanoscience and Nanotechnology ◽

10.1166/jnn.2019.17102 ◽

2019 ◽

Vol 19 (10) ◽

pp. 6746-6749 ◽

Cited By ~ 1

Author(s):

Taejin Jang ◽

Myung-Hyun Baek ◽

Min-Woo Kwon ◽

Sungmin Hwang ◽

Jeesoo Chang ◽

...

Keyword(s):

Gate Length ◽

Carrier Injection ◽

Hot Carrier ◽

Hot Carrier Injection

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A 0.5-V Hybrid SRAM Physically Unclonable Function Using Hot Carrier Injection Burn-In for Stability Reinforcement

IEEE Journal of Solid-State Circuits ◽

10.1109/jssc.2020.3035207 ◽

2020 ◽

pp. 1-1

Author(s):

Kunyang Liu ◽

Xinpeng Chen ◽

Hongliang Pu ◽

Hirofumi Shinohara

Keyword(s):

Carrier Injection ◽

Hot Carrier ◽

Hot Carrier Injection

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Effects of Different Gate Stress Conditions on Hot Carrier Injection in High Voltage N-Channel CMOS

2021 China Semiconductor Technology International Conference (CSTIC) ◽

10.1109/cstic52283.2021.9461476 ◽

2021 ◽

Author(s):

Lei Li ◽

Sarah Zhou ◽

Kelly Yang

Keyword(s):

High Voltage ◽

Stress Conditions ◽

Carrier Injection ◽

Hot Carrier ◽

Hot Carrier Injection

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Plasmon-Triggered Upconversion Emissions and Hot Carrier Injection for Combinatorial Photothermal and Photodynamic Cancer Therapy

ACS Applied Materials & Interfaces ◽

10.1021/acsami.1c21949 ◽

2021 ◽

Author(s):

Subin Yu ◽

Dohyub Jang ◽

Hong Yuan ◽

Wen-Tse Huang ◽

Minju Kim ◽

...

Keyword(s):

Cancer Therapy ◽

Carrier Injection ◽

Hot Carrier ◽

Hot Carrier Injection ◽

Photodynamic Cancer Therapy ◽

Upconversion Emissions

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Hot Carrier Injection Phenomenon due to Excessive Natural Local Self-Boosting Effect in 3D NAND Flash Memory

10.7567/ssdm.2019.ps-2-07 ◽

2019 ◽

Author(s):

Y. Jeong ◽

I. Ham ◽

S.J. Baik ◽

M. Kang

Keyword(s):

Flash Memory ◽

Nand Flash ◽

Carrier Injection ◽

Nand Flash Memory ◽

Hot Carrier ◽

Hot Carrier Injection

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Evidence of acceptor-like oxide defects created by hot-carrier injection in n-MOSFET's: a charge-pumping study

IEEE Electron Device Letters ◽

10.1109/55.75703 ◽

1991 ◽

Vol 12 (2) ◽

pp. 60-62 ◽

Cited By ~ 26

Author(s):

D. Vuillaume ◽

J.C. Marchetaux ◽

A. Boudou

Keyword(s):

Carrier Injection ◽

Charge Pumping ◽

Hot Carrier ◽

Hot Carrier Injection ◽

Oxide Defects ◽

A Charge

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Total dose dependence of hot carrier injection effect in the NMOS devices

2014 IEEE International Conference on Electron Devices and Solid-State Circuits ◽

10.1109/edssc.2014.7061213 ◽

2014 ◽

Author(s):

Yujuan He ◽

Xiaowen Zhang

Keyword(s):

Total Dose ◽

Dose Dependence ◽

Carrier Injection ◽

Hot Carrier ◽

Hot Carrier Injection ◽

Injection Effect

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Influence of Design Considerations on Hot Carrier Injection Degradation of STI-based LDMOS Transistors

2018 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) ◽

10.1109/ipfa.2018.8452504 ◽

2018 ◽

Cited By ~ 3

Author(s):

A. F. M. Alimin ◽

S. F. W. M. Hatta ◽

N. Soin

Keyword(s):

Carrier Injection ◽

Hot Carrier ◽

Design Considerations ◽

Hot Carrier Injection

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An Equivalent Circuit of Hot Carrier Injection in Short-channel N-MOSFET

10.1109/icicm54364.2021.9660244 ◽

2021 ◽

Author(s):

Jun'An Zhang ◽

Jin'Xin Hu ◽

Tie'Hu Li

Keyword(s):

Equivalent Circuit ◽

Carrier Injection ◽

Short Channel ◽

Hot Carrier ◽

Hot Carrier Injection

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