Influence of Design Considerations on Hot Carrier Injection Degradation of STI-based LDMOS Transistors

Author(s):  
A. F. M. Alimin ◽  
S. F. W. M. Hatta ◽  
N. Soin
2019 ◽  
Vol 19 (10) ◽  
pp. 6746-6749 ◽  
Author(s):  
Taejin Jang ◽  
Myung-Hyun Baek ◽  
Min-Woo Kwon ◽  
Sungmin Hwang ◽  
Jeesoo Chang ◽  
...  

1999 ◽  
Vol 86 (11) ◽  
pp. 6590-6592 ◽  
Author(s):  
Byung Jin Cho ◽  
Zhen Xu ◽  
Hao Guan ◽  
M. F. Li

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