Performance dependence of CMOS on silicon substrate orientation for ultrathin oxynitride and HfO2 gate dielectrics

2003 ◽  
Vol 24 (5) ◽  
pp. 339-341 ◽  
Author(s):  
Min Yang ◽  
E.P. Gusev ◽  
Meikei Ieong ◽  
O. Gluschenkov ◽  
D.C. Boyd ◽  
...  
1996 ◽  
Vol 102 ◽  
pp. 159-162 ◽  
Author(s):  
Gy. Molnár ◽  
G. Pet″o ◽  
E. Zsoldos ◽  
Z.E. Horváth ◽  
N.Q. Khánh

2006 ◽  
Vol 966 ◽  
Author(s):  
C.Y. Liu ◽  
Tseung-Yuen Tseng

ABSTRACTAmong various possible candidates of high-k gate dielectrics, SrTiO3 plays an important role because it has high dielectric constant and it can be epitaxially grown on silicon substrate. The fabrication process and properties of SrTiO3 gate dielectrics are reported. The effect of the addition of SiO2 on the microstructure and electrical properties of SrTiO3 gate dielectric is also presented. The minimization of the effect of interfacial layer between SrTiO3 and Si is the most important issue for obtaining high quality high-k gate dielectrics. The possible methods to improve the interfacial properties and the measurement techniques to characterize the interfacial layer are discussed.


2005 ◽  
Vol 2 (9) ◽  
pp. 3389-3393 ◽  
Author(s):  
S. Uehara ◽  
K. Kubota ◽  
K. Nagaoka ◽  
S. Yoshida ◽  
T. Matsubara

2017 ◽  
Vol 888 ◽  
pp. 304-308 ◽  
Author(s):  
Kuan Ying Kok ◽  
Inn Khuan Ng ◽  
Nur Ubaidah Saidin ◽  
Thye Foo Choo ◽  
Boon Siong Wee ◽  
...  

Electrochemical route has been a favorite technique for the fabrication of ZnO as it is relatively cheap and capable of producing abundance amount of materials. In this paper, we investigate the morphologies of hydrothermally synthesized ZnO structures assisted by galvanic process on conducting Au-coated silicon substrate. To induce the galvanic process, the substrate was in contact with aluminum so that the difference in the reduction potentials between the two materials provided the driving force for the formation of the ZnO structures. The galvanic process was found to promote compact and anisotropy growth of ZnO nanorods along the (001) plane. It was also found that substrate orientations in the electrolyte solution had an important bearing on the morphologies of ZnO. Well aligned periodic hexagonal arrays of ZnO nanorods of homogeneous diameters were obtained on gold-coated Si substrate with face-down orientation in the electrolyte solution.


2020 ◽  
Vol 504 ◽  
pp. 166705
Author(s):  
Vinicius Pretti Rossi ◽  
Ricardo Pereira Bonini ◽  
André Marino Gonçalves ◽  
Alexandre José Gualdi ◽  
Jose Antônio Eiras ◽  
...  

2020 ◽  
Vol 312 ◽  
pp. 98-104
Author(s):  
Tatiana A. Pisarenko ◽  
Vladimir V. Korobtsov ◽  
Vyacheslav V. Balashev ◽  
Artem A. Dimitriev ◽  
Sophie V. Bondarenko

We report on the results of a study of the lateral photovoltaic effect in theFe3O4/SiO2/n-Si structure grown on Si(001) and Si(111) substrates. It was found that in theFe3O4/SiO2/Si(001) structure the LPE sensitivity is a half times as much, and the photoresponseparameters are about 3 times less than those in the Fe3O4/SiO2/Si(111) structure. It is supposed thata higher sensitivity and faster photoresponse in the Fe3O4/SiO2/Si(001) structure, compared with theFe3O4/SiO2/Si(111) structure, are caused by a lower density of surface states at the SiO2/Si(001)interface than at the SiO2/Si(111) interface.


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