Performance dependence of CMOS on silicon substrate orientation for ultrathin oxynitride and HfO2 gate dielectrics
2003 ◽
Vol 24
(5)
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pp. 339-341
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1996 ◽
Vol 102
◽
pp. 159-162
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2005 ◽
Vol 2
(9)
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pp. 3389-3393
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2017 ◽
Vol 888
◽
pp. 304-308
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2020 ◽
Vol 504
◽
pp. 166705
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