Defining the Role of Silicon Substrate Orientation on the Polycrystalline Diamond Film: A Novel Approach for Characterizing Faceted Microstructures

2017 ◽  
Vol 17 (10) ◽  
pp. 5366-5376
Author(s):  
L. Jain ◽  
K. V. Mani Krishna ◽  
Aditya Prasad ◽  
H. K. Mehtani ◽  
D. S. Misra ◽  
...  
Keyword(s):  
Diamond Film ◽  
Silicon Substrate ◽  
Polycrystalline Diamond ◽  
Substrate Orientation ◽  
Novel Approach ◽  
Polycrystalline Diamond Film

Delamination/Rupture of Polycrystalline Diamond Film: Defining Role of Shear Anisotropy

2017 ◽  
Vol 17 (4) ◽  
pp. 1514-1523 ◽  
Author(s):  
L. Jain ◽  
Reeti Bajpai ◽  
Ritwik Basu ◽  
Devi Shanker Misra ◽  
Indradev Samajdar
Keyword(s):  
Diamond Film ◽  
Polycrystalline Diamond ◽  
Polycrystalline Diamond Film

Fracture observation of polycrystalline diamond film under indentation test

2004 ◽  
Vol 13 (11-12) ◽  
pp. 2024-2030 ◽  
Author(s):  
R. Ikeda ◽  
M. Hayashi ◽  
A. Yonezu ◽  
T. Ogawa ◽  
M. Takemoto
Keyword(s):  
Diamond Film ◽  
Indentation Test ◽  
Polycrystalline Diamond ◽  
Polycrystalline Diamond Film

High Resolution Tem Study of Diamond Formation on Silicon and Molybdenum Field Emitter Surfaces

1994 ◽  
Vol 354 ◽  
Author(s):  
A. F. Myers ◽  
J. Liu ◽  
W. B. Choi ◽  
G. J. Wojak ◽  
J. J. Hren
Keyword(s):  
High Resolution ◽  
Diamond Film ◽  
Microwave Plasma ◽  
Chemical Vapor ◽  
Polycrystalline Diamond ◽  
Plasma Chemical Vapor Deposition ◽  
Field Emitters ◽  
High Resolution Tem ◽  
Diffraction Patterns ◽  
Polycrystalline Diamond Film

AbstractDiamond is an attractive material for coating microfabricated metal and semiconductor field emitters, since it enhances the stability and emission characteristics of the emitter. In the present study, polycrystalline diamond thin films were grown on silicon and molybdenum field emitters by microwave plasma chemical vapor deposition, using the bias-enhanced nucleation technique. High resolution transmission electron microscopy (TEM) was used to analyze the morphology of the diamond film and the structure of the diamond/emitter interface. Electron diffraction patterns and high resolution images indicate the presence of a polycrystalline diamond film, as well as a polycrystalline SiC layer between the diamond film and the Si emitter. A carbide interlayer was also found to exist between the diamond and the Mo emitter surface. Parallel electron energy loss spectroscopy confirms the TEM identification of a polycrystalline diamond film.

The Characteristics of Diamond Film Deposited by Magnet-Enhanced Plasma Jet CVD

1996 ◽  
Author(s):  
K. Zhou ◽  
M. Dair ◽  
D. Wang ◽  
P. Han ◽  
B. Feng
Keyword(s):  
Magnetic Field ◽  
Diamond Film ◽  
Polycrystalline Diamond ◽  
Plasma Jet ◽  
Magnetic Effect ◽  
X Ray Diffraction ◽  
X Ray ◽  
Crystal Perfection ◽  
Polycrystalline Diamond Film ◽  
Scanning Electron

Abstract A diameter of 30 mm polycrystalline diamond film has been deposited by magnet-enhanced DC plasma jet CVD. The diamond film was characterized by X-ray diffraction, Raman spectroscopy, scanning electron microscopy and surface profilograph. Results reveal that under the same depositing parameters, magnetic field can increase purity of diamond film, improve thickness uniformity of diamond film, but no influence on crystal perfection and size of microcrystal of diamond film. A discussion on magnetic effect is presented.

Sensitive Elements of High Temperature Pressure Sensors Formed from a Doped Polycrystalline Diamond

2021 ◽  
Vol 1031 ◽  
pp. 178-183
Author(s):  
Elena Vysotina ◽  
Razhudin Rizakhanov ◽  
Sergey Sigalaev ◽  
Nikolay Polushin ◽  
Vadim Shokorov ◽  
...  
Keyword(s):  
High Temperature ◽  
Diamond Film ◽  
Pressure Sensors ◽  
Polycrystalline Diamond ◽  
Resistance Strain ◽  
Promising Material ◽  
Strain Gauges ◽  
Extreme Conditions ◽  
Boron Doped ◽  
Polycrystalline Diamond Film

The need to create highly accurate pressure sensors that capable operate under extreme conditions in aviation, rocket and space equipment increases and becomes more relevant. The unique properties of diamond make it a promising material for microelectronic sensors. Sensitive elements of pressure sensors were developed where a resilient element is formed from silicon but resistance strain gauges are formed from a boron-doped polycrystalline diamond film.

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