On Optimizing Scan Testing Power and Routing Cost in Scan Chain Design

2006 ◽  
Author(s):  
Li-Chung Hsu ◽  
Hung-Ming Chen
Keyword(s):  
Scan Testing ◽  
Testing Power ◽  
Scan Chain ◽  
Scan Chain Design

scholarly journals Power-scan chain: design for analog testability

2006 ◽  
Author(s):  
A. Zjajo ◽  
Henk Jan Bergveld ◽  
R. Schuttert ◽  
J. Pineda de Gyvez
Keyword(s):  
Scan Chain ◽  
Scan Chain Design

A SAT-Based Pattern Generation Method for Diagnosis Multiple Scan Chain Faults

2011 ◽  
Vol 301-303 ◽  
pp. 989-994
Author(s):  
Fei Wang ◽  
Da Wang ◽  
Hai Gang Yang
Keyword(s):  
Failure Analysis ◽  
Design For Testability ◽  
Pattern Generation ◽  
Diagnostic Process ◽  
High Quality ◽  
Analysis Process ◽  
Short Period ◽  
Multiple Scan ◽  
Scan Chain ◽  
Scan Chain Design

Scan chain design is a widely used design-for-testability (DFT) technique to improve test and diagnosis quality. However, failures on scan chain itself account for up to 30% of chip failures. To diagnose root causes of scan chain failures in a short period is vital to failure analysis process and yield improvements. As the conventional diagnosis process usually runs on the faulty free scan chain, scan chain faults may disable the diagnostic process, leaving large failure area to time-consuming failure analysis. In this paper, a SAT-based technique is proposed to generate patterns to diagnose scan chain faults. The proposed work can efficiently generate high quality diagnostic patterns to achieve high diagnosis resolution. Moreover, the computation overhead of proving equivalent faults is reduced. Experimental results on ISCAS’89 benchmark circuits show that the proposed method can reduce the number of diagnostic patterns while achieving high diagnosis resolution.

Clock-Skew-Aware Scan Chain Grouping for Mitigating Shift Timing Failures in Low-Power Scan Testing

2018 ◽  
Author(s):  
Yucong Zhang ◽  
Xiaoqin Wen ◽  
Stefan Holst ◽  
Kohei Miyase ◽  
Seiji Kajihara ◽  
...  
Keyword(s):  
Low Power ◽  
Clock Skew ◽  
Scan Testing ◽  
Scan Chain

Scan chain design for shift power reduction in scan-based testing

2011 ◽  
Vol 54 (4) ◽  
pp. 767-777
Author(s):  
Jia Li ◽  
Yu Hu ◽  
XiaoWei Li
Keyword(s):  
Power Reduction ◽  
Scan Chain ◽  
Scan Chain Design

Power-Driven Routing-Constrained Scan Chain Design

2004 ◽  
Vol 20 (6) ◽  
pp. 647-660 ◽  
Author(s):  
Y. Bonhomme ◽  
P. Girard ◽  
L. Guiller ◽  
C. Landrault ◽  
S. Pravossoudovitch
Keyword(s):  
Scan Chain ◽  
Scan Chain Design
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