Critical Charge Characterization for Soft Error Rate Modeling in 90nm SRAM

Author(s):  
Riaz Naseer ◽  
Younes Boulghassoul ◽  
Jeff Draper ◽  
Sandeepan DasGupta ◽  
Art Witulski
Author(s):  
B. Narasimham ◽  
V. Chaudhary ◽  
M. Smith ◽  
L. Tsau ◽  
D. Ball ◽  
...  

Author(s):  
Kenan Ünlü ◽  
Vijaykrishnan Narayanan ◽  
Sacit M. Çetiner ◽  
Vijay Degalahal ◽  
Mary J. Irwin

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