Built-in self-test and fault diagnosis for lookup table FPGAs

2002 ◽  
Author(s):  
Shyue-Kung Lu ◽  
Jen-Sheng Shih ◽  
Cheng-Wen Wu
Keyword(s):  
Fault Diagnosis ◽  
Lookup Table ◽  
Self Test ◽  
Built In Self Test

scholarly journals Two-functional µBIST for Testing and Self-Diagnosis of Analog Circuits in Electronic Embedded Systems

ACTA IMEKO ◽  
2014 ◽  
Vol 3 (4) ◽  
pp. 10
Author(s):  
Dariusz Zaleski ◽  
Romuald Zielonko
Keyword(s):  
Fault Diagnosis ◽  
Embedded Systems ◽  
Analog Circuits ◽  
Functional Testing ◽  
Mixed Signal ◽  
Self Test ◽  
Built In Self Test

The paper concerns the testing of analog circuits and blocks in mixed-signal Electronic Embedded Systems (EESs), using the Built-in Self-Test (BIST) technique. An integrated, two-functional, embedded microtester (µBIST) based on reuse of signal blocks already present in an EES, such as microprocessors, memories, ADCs, DACs, is presented. The novelty of the µBIST solution is its extended functionality. It can perform 2 testing functions: functional testing and fault diagnosis on the level of localization of a faulty element. For functional testing the Complementary Signals (CSs), and for fault diagnosis the Simulation Before Test (SBT) vocabulary techniques have been used. In the fault vocabulary the graphical signatures in the form of identification curves in multidimensional spaces have been applied.

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