Built-in self-test (BIST) structure for analog circuit fault diagnosis
1990 ◽
Vol 39
(3)
◽
pp. 517-521
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Keyword(s):
1992 ◽
Vol 41
(4)
◽
pp. 535-539
◽
Keyword(s):
Keyword(s):
2010 ◽
Vol 24
(1)
◽
pp. 17-22
◽
2010 ◽
Vol 24
(2)
◽
pp. 107-112
◽
Keyword(s):
2014 ◽
Vol 981
◽
pp. 3-10
◽
Keyword(s):
Keyword(s):