Alternative built-in self-test (BIST) structures for analogue circuit fault diagnosis

C.-L. Wey

doi:10.1049/el:19911017

Alternative built-in self-test (BIST) structures for analogue circuit fault diagnosis

Electronics Letters ◽

10.1049/el:19911017 ◽

1991 ◽

Vol 27 (18) ◽

pp. 1627 ◽

Cited By ~ 6

Author(s):

C.-L. Wey

Keyword(s):

Fault Diagnosis ◽

Analogue Circuit ◽

Self Test ◽

Built In Self Test ◽

Circuit Fault Diagnosis

Download Full-text

Built-in self-test (BIST) structures for analog circuit fault diagnosis with current test data

IEEE Transactions on Instrumentation and Measurement ◽

10.1109/19.155921 ◽

1992 ◽

Vol 41 (4) ◽

pp. 535-539 ◽

Cited By ~ 32

Author(s):

C.-L. Wey ◽

S. Krishman

Keyword(s):

Fault Diagnosis ◽

Test Data ◽

Analog Circuit ◽

Current Test ◽

Self Test ◽

Built In Self Test ◽

Circuit Fault Diagnosis

Download Full-text

Built-in self-test (BIST) structure for analog circuit fault diagnosis

IEEE Transactions on Instrumentation and Measurement ◽

10.1109/19.106284 ◽

1990 ◽

Vol 39 (3) ◽

pp. 517-521 ◽

Cited By ~ 92

Author(s):

C.-L. Wey

Keyword(s):

Fault Diagnosis ◽

Analog Circuit ◽

Self Test ◽

Built In Self Test ◽

Circuit Fault Diagnosis

Download Full-text

Analogue circuit fault diagnosis based on convolution neural network

Electronics Letters ◽

10.1049/el.2019.2892 ◽

2019 ◽

Vol 55 (24) ◽

pp. 1277-1279

Author(s):

Tao Du ◽

Hao Zhang ◽

Ling Wang

Keyword(s):

Neural Network ◽

Fault Diagnosis ◽

Convolution Neural Network ◽

Analogue Circuit ◽

Circuit Fault Diagnosis

Download Full-text

A built in self test scheme for automatic interconnect fault diagnosis in multiple and single FPGA systems

2007 50th Midwest Symposium on Circuits and Systems ◽

10.1109/mwscas.2007.4488577 ◽

2007 ◽

Cited By ~ 5

Author(s):

M. Y. Niamat ◽

Arunjit Sahni ◽

M. M. Jamali

Keyword(s):

Fault Diagnosis ◽

Test Scheme ◽

Self Test ◽

Built In Self Test

Download Full-text

Built-in Self-Test and Fault Diagnosis for Lab-on-Chip Using Digital Microfluidic Logic Gates

2008 IEEE International Test Conference ◽

10.1109/test.2008.4700635 ◽

2008 ◽

Author(s):

Yang Zhao ◽

Tao Xu ◽

K. Chakrabarty

Keyword(s):

Fault Diagnosis ◽

Logic Gates ◽

Lab On Chip ◽

Self Test ◽

Built In Self Test ◽

On Chip ◽

Digital Microfluidic

Download Full-text

Neural-network-based approaches for analogue circuit fault diagnosis

Test and Diagnosis of Analogue, Mixed-Signal and RF Integrated Circuits: the system on chip approach ◽

10.1049/pbcs019e_ch3 ◽

2011 ◽

pp. 83-112

Author(s):

Yichuang Sun ◽

Yigang He

Keyword(s):

Neural Network ◽

Fault Diagnosis ◽

Analogue Circuit ◽

Circuit Fault Diagnosis

Download Full-text

Built-in self-test and fault diagnosis for lookup table FPGAs

2000 IEEE International Symposium on Circuits and Systems. Emerging Technologies for the 21st Century. Proceedings (IEEE Cat No.00CH36353) ◽

10.1109/iscas.2000.857031 ◽

2002 ◽

Cited By ~ 1

Author(s):

Shyue-Kung Lu ◽

Jen-Sheng Shih ◽

Cheng-Wen Wu

Keyword(s):

Fault Diagnosis ◽

Lookup Table ◽

Self Test ◽

Built In Self Test

Download Full-text

Built-in Self-test And Fault Diagnosis Of Fully Differential Analogue Circuits

IEEE/ACM International Conference on Computer-Aided Design ◽

10.1109/iccad.1994.629857 ◽

2005 ◽

Cited By ~ 5

Author(s):

S. Mir ◽

V. Kolarik ◽

M. Lubaszewski ◽

C. Nielsen ◽

B. Courtois

Keyword(s):

Fault Diagnosis ◽

Fully Differential ◽

Analogue Circuits ◽

Self Test ◽

Built In Self Test

Download Full-text

Sensor Fusion in Analogue Circuit Fault Diagnosis Using Transferable Belief Model

Proceedings of the 2nd International Conference on Computer Science and Electronics Engineering (ICCSEE 2013) ◽

10.2991/iccsee.2013.325 ◽

2013 ◽

Author(s):

Youhui Chen ◽

Dong Cheng ◽

Yimin Yang ◽

Zan Xiao

Keyword(s):

Fault Diagnosis ◽

Sensor Fusion ◽

Analogue Circuit ◽

Circuit Fault Diagnosis ◽

Belief Model ◽

Transferable Belief Model

Download Full-text

Built-in Self-Test Design for Fault Detection and Fault Diagnosis in SRAM-Based FPGA

IEEE Transactions on Instrumentation and Measurement ◽

10.1109/tim.2009.2013921 ◽

2009 ◽

Vol 58 (7) ◽

pp. 2300-2315 ◽

Cited By ~ 17

Author(s):

Chun-Lung Hsu ◽

Ting-Hsuan Chen

Keyword(s):

Fault Diagnosis ◽

Fault Detection ◽

Test Design ◽

Self Test ◽

Built In Self Test

Download Full-text