Electrooptic characterization of PLT/sub 28/ thin films by a guided-wave optical technique

2002 ◽  
Author(s):  
E. Dogheche ◽  
A. Boudrioua ◽  
D. Remiens ◽  
J.C. Loulergue
Keyword(s):  
Thin Films ◽  
Guided Wave ◽  
Optical Technique

Guided-wave electro-optic characterization of BaTiO_3 thin films using the prism coupling technique

2013 ◽  
Vol 38 (7) ◽  
pp. 1037 ◽  
Author(s):  
Floriane Leroy ◽  
Anthony Rousseau ◽  
Sandrine Payan ◽  
Elhadj Dogheche ◽  
David Jenkins ◽  
...  
Keyword(s):  
Thin Films ◽  
Guided Wave ◽  
Coupling Technique ◽  
Electro Optic ◽  
Prism Coupling

Preparation and Characterization of Metal Alkoxide Derived Epitaxial Lead Titanate Based Thin Films

1994 ◽  
Vol 361 ◽  
Author(s):  
Keiichi Nashimoto ◽  
Shigetoshi Nakamura
Keyword(s):  
Thin Films ◽  
Lead Titanate ◽  
Solid Phase ◽  
Sol Gel ◽  
Pyrochlore Phase ◽  
Guided Wave ◽  
Metal Alkoxide ◽  
Rocking Curve ◽  
Sol Gel Process

ABSTRACTEpitaxial and highly oriented lead titanate based thin films were prepared by a sol-gel process using non-hydrolyzed methoxyethoxide precursors and RTA process. PbTiO3 crystallized with preferred (001) or (100) orientation on SrTiO3 (100) and MgO (100). Solid phase (001) oriented epitaxial growth of PZT on SrTio3 was observed at 425°C, directly from the amorphous phase. That of PZT on MgO was observed at temperatures above 550°C, after the formation of pyrochlore phase. The PZT on SrTiO3 had a single (001) orientation and rocking curve full width at half maximum less than 0.08°. PZT showed a weak preferred (111) orientation on sapphire (0001) substrates, while highly (111) oriented PLT thin films were obtained on them. The guided wave modes were excited by a prism coupling for PZT thin films crystallized on SrTiO3 and MgO. Electrical properties of epitaxial PZT and PLT thin films on Nb-SrTiO3 substrates were characterized.

OPTICAL AND MORPHOLOGICAL CHARACTERIZATION OF (ZnO)x(CdO)1-x THIN FILMS

2001 ◽  
Vol 15 (17n19) ◽  
pp. 663-666
Author(s):  
L. VAILLANT ◽  
O. VIGIL ◽  
G. CONTRERAS-PUENTE ◽  
C. MEJÍA-GARCÍA
Keyword(s):  
Electron Microscopy ◽  
Thin Films ◽  
Scanning Electron Microscopy ◽  
Surface Morphology ◽  
Morphological Characterization ◽  
Morphological Properties ◽  
Optical Technique ◽  
Semiconductor Thin Films ◽  
Scanning Electron

The optical and morphological properties of (ZnO)x(CdO)1-x semiconductor thin films with x composition in the range 0 □ x □ 0.5 are studied by the photoluminescence optical technique (PL), and the Scanning Electron Microscopy (SEM). The evolution of the band associated with oxygen content in the films is observed and described as a function of the film composition and the thermal annealing. The surface morphology is presented, where two different binary semiconducting species can be discerned in proportions dependent on the films composition.

Electron microscopic characterization of diamond thin films and substrates for diamond heteroepitaxial growth

1989 ◽  
Vol 47 ◽  
pp. 592-593
Author(s):  
J.B. Posthill ◽  
R.P. Burns ◽  
R.A. Rudder ◽  
Y.H. Lee ◽  
R.J. Markunas ◽  
...  
Keyword(s):  
Thin Films ◽  
Wide Band ◽  
Deposition Process ◽  
Heteroepitaxial Growth ◽  
Electron Microscopic ◽  
Wide Band Gap ◽  
Lattice Matching ◽  
Different Types ◽  
Diamond Thin Films

Because of diamond’s wide band gap, high thermal conductivity, high breakdown voltage and high radiation resistance, there is a growing interest in developing diamond-based devices for several new and demanding electronic applications. In developing this technology, there are several new challenges to be overcome. Much of our effort has been directed at developing a diamond deposition process that will permit controlled, epitaxial growth. Also, because of cost and size considerations, it is mandatory that a non-native substrate be developed for heteroepitaxial nucleation and growth of diamond thin films. To this end, we are currently investigating the use of Ni single crystals on which different types of epitaxial metals are grown by molecular beam epitaxy (MBE) for lattice matching to diamond as well as surface chemistry modification. This contribution reports briefly on our microscopic observations that are integral to these endeavors.

Deposition and Characterization of Al2O3 and BiFeO3 Thin Films on Titanium Substrates for Tough MEMS Devices

2017 ◽  
Vol 137 (1) ◽  
pp. 46-47
Author(s):  
Takeshi Kohno ◽  
Masato Mihara ◽  
Ataru Tanabe ◽  
Takashi Abe ◽  
Masanori Okuyama ◽  
...  
Keyword(s):  
Thin Films ◽  
Mems Devices ◽  
Titanium Substrates

Vapor Deposition Polymerization and Electrical Characterization of TPD Thin Films

2011 ◽  
Vol E94-C (2) ◽  
pp. 157-163 ◽  
Author(s):  
Masakazu MUROYAMA ◽  
Ayako TAJIRI ◽  
Kyoko ICHIDA ◽  
Seiji YOKOKURA ◽  
Kuniaki TANAKA ◽  
...  
Keyword(s):  
Thin Films ◽  
Vapor Deposition ◽  
Electrical Characterization

Preparation and Characterization of Polymer Blend (PVA/PEO) Filled with Methyl Orange Thin Films

2018 ◽  
Vol 14 (2) ◽  
pp. 221-234
Author(s):  
Ahmed Namah Mohamed ◽  
◽  
Jafer Fahdel Odah ◽  
Haider Tawfiq Naeem
Keyword(s):  
Thin Films ◽  
Methyl Orange ◽  
Polymer Blend
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