Development of microelectronics reliability technology in China

2009 16th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits ◽

10.1109/ipfa.2009.5232709 ◽

2009 ◽

Cited By ~ 1

Author(s):

Kong Xuedong ◽

Huang Yun ◽

Yang Shaohua

Keyword(s):

Microelectronics Reliability

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Impact of low K dielectrics on microelectronics reliability

Canadian Conference on Electrical and Computer Engineering, 2005. ◽

10.1109/ccece.2005.1557029 ◽

2006 ◽

Cited By ~ 4

Author(s):

D. Scansen ◽

R. Haythornthwaite ◽

S. Brown

Keyword(s):

Microelectronics Reliability ◽

Low K

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Microelectronics reliability predictions derived from component defect densities

Microelectronics Reliability ◽

10.1016/0026-2714(91)90386-l ◽

1991 ◽

Vol 31 (1) ◽

pp. 201

Keyword(s):

Microelectronics Reliability ◽

Defect Densities

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Erratum to “A simple and fundamental design rule for resisting delamination in bimaterial structures” [Microelectronics Reliability 2003;43:487–494]

Microelectronics Reliability ◽

10.1016/s0026-2714(03)00116-1 ◽

2003 ◽

Vol 43 (7) ◽

pp. 1169

Author(s):

Thomas D. Moore ◽

John L. Jarvis

Keyword(s):

Design Rule ◽

Microelectronics Reliability ◽

Fundamental Design

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From chemical building blocks of polymers to microelectronics reliability

5th International Conference on Thermal and Mechanical Simulation and Experiments in Microelectronics and Microsystems 2004 EuroSimE 2004 Proceedings of the ESIME-04 ◽

10.1109/esime.2004.1304101 ◽

2004 ◽

Cited By ~ 2

Author(s):

H.J.L. Bressers ◽

W.D. van Driel ◽

K.M.B. Jansen ◽

L.J. Ernst ◽

G.Q. Zhang

Keyword(s):

Building Blocks ◽

Microelectronics Reliability

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From “Star Trek” to “Avatar”: Microelectronics reliability in the 21st century

2012 IEEE International Reliability Physics Symposium (IRPS) ◽

10.1109/irps.2012.6241758 ◽

2012 ◽

Author(s):

Carl McCants

Keyword(s):

21St Century ◽

Star Trek ◽

Microelectronics Reliability

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Erratum to “The effect of image potential on electron transmission and electric current in the direct tunneling regime of ultra-thin MOS structures” [Microelectronics Reliability 2001;41:927–931]

Microelectronics Reliability ◽

10.1016/s0026-2714(02)00072-0 ◽

2002 ◽

Vol 42 (6) ◽

pp. 991

Author(s):

Lingfeng Mao ◽

Changhua Tan ◽

Mingzhen Xu

Keyword(s):

Electric Current ◽

Electron Transmission ◽

Direct Tunneling ◽

Microelectronics Reliability ◽

Mos Structures

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Effect of non-uniform current distribution in the via patterns on microelectronics reliability

Annual Reliability and Maintainability Symposium 1993 Proceedings ◽

10.1109/rams.1993.296820 ◽

2002 ◽

Author(s):

A.D. Dixit ◽

K. Hirakawa ◽

A. Burghard

Keyword(s):

Current Distribution ◽

Uniform Current ◽

Microelectronics Reliability ◽

Uniform Current Distribution

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Erratum to “An algorithm for calculating the lower confidence bounds of CPU and CPL with application to low-drop-out linear regulators” [Microelectronics Reliability 2003;43:495–502]

Microelectronics Reliability ◽

10.1016/s0026-2714(03)00187-2 ◽

2003 ◽

Vol 43 (8) ◽

pp. 1349

Author(s):

W.L. Pearn ◽

Ming-Hung Shu

Keyword(s):

Drop Out ◽

Confidence Bounds ◽

Lower Confidence ◽

Microelectronics Reliability ◽

Lower Confidence Bounds ◽

Linear Regulators

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Tutorial: temperature as an input to microelectronics-reliability models

Microelectronics Reliability ◽

10.1016/s0026-2714(97)87699-8 ◽

1997 ◽

Vol 37 (4) ◽

pp. 697

Keyword(s):

Reliability Models ◽

Microelectronics Reliability

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Chapter 21, New developments in microelectronics reliability

5th International Conference on Thermal and Mechanical Simulation and Experiments in Microelectronics and Microsystems 2004 EuroSimE 2004 Proceedings of the ESIME-04 ◽

10.1109/esime.2004.1338224 ◽

2004 ◽

Keyword(s):

New Developments ◽

Microelectronics Reliability

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