Effect of non-uniform current distribution in the via patterns on microelectronics reliability
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2005 ◽
Vol 67
(7)
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pp. 729-737
2019 ◽
Vol 1293
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pp. 012065
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2006 ◽
Vol 81
(20-22)
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pp. 2491-2495
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2012 ◽
Vol 11
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pp. 1576-1579
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1996 ◽
Vol 32
(4)
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pp. 2858-2861
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1986 ◽
Vol 28
(11)
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pp. 1675-1689
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