Effect of non-uniform current distribution in the via patterns on microelectronics reliability

Author(s):  
A.D. Dixit ◽  
K. Hirakawa ◽  
A. Burghard
2006 ◽  
Vol 81 (20-22) ◽  
pp. 2491-2495 ◽  
Author(s):  
Gourab Bansal ◽  
Kazutaka Seo ◽  
Nagato Yanagi ◽  
Tsutomu Hemmi ◽  
Kazuya Takahata ◽  
...  

1996 ◽  
Vol 32 (4) ◽  
pp. 2858-2861 ◽  
Author(s):  
Y. Wadayama ◽  
N. Koizumi ◽  
Y. Takahashi ◽  
K. Matsui ◽  
H. Tsuji ◽  
...  

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