Trend in DRAM Soft Errors

2006 ◽  
Author(s):  
G. Schindlbeck
Keyword(s):  
Soft Errors

Analysis of Induced End-of-Life Failures in SRAM Through Nanoprobing

2018 ◽  
Author(s):  
Oberon Dixon-Luinenburg ◽  
Jordan Fine
Keyword(s):  
End Of Life ◽  
Soft Errors ◽  
Cause Analysis ◽  
New Approach ◽  
Performance Loss ◽  
Root Cause ◽  
Long Period ◽  
Atomic Force ◽  
Stress Resultant ◽  
Voltage Stress

Abstract In this paper, we demonstrate a novel nanoprobing approach to establish cause-and-effect relationships between voltage stress and end-of-life performance loss and failure in SRAM cells. A Hyperion II Atomic Force nanoProber was used to examine degradation for five 6T cells on an Intel 14 nm processor. Ten minutes of asymmetrically applied stress at VDD=2 V was used to simulate a ‘0’ bit state held for a long period, subjecting each pullup and pulldown to either VDS or VGS stress. Resultant degradation caused read and hold margins to be reduced by 20% and 5% respectively for the ‘1’ state and 5% and 2% respectively for the ‘0’ state. ION was also reduced, for pulldown and pullup respectively, by 4.5% and 5.4% following VGS stress and 2.6% and 33.8% following VDS stress. Negative read margin failures, soft errors, and read time failures all become more prevalent with these aging symptoms whereas write stability is improved. This new approach enables highly specific root cause analysis and failure prediction for end-of-life in functional on-product SRAM.

Mitigating Process Variability and Soft Errors at Circuit-Level for FinFETs

2021 ◽  
Author(s):  
Alexandra Zimpeck ◽  
Cristina Meinhardt ◽  
Laurent Artola ◽  
Ricardo Reis
Keyword(s):  
Soft Errors ◽  
Process Variability

Towards Tolerating Soft Errors for Embedded Systems

2021 ◽  
Vol 2 (2) ◽  
Author(s):  
Muhammad Sheikh Sadi ◽  
Waseem Ahmed ◽  
Jan Jürjens
Keyword(s):  
Embedded Systems ◽  
Soft Errors

Soft errors in SRAM-FPGAs: A comparison of two complementary approaches

2007 ◽  
Author(s):  
Monica Alderighi ◽  
Fabio Casini ◽  
Sergio D'Angelo ◽  
Marcello Mancini ◽  
Sandro Pastore ◽  
...  
Keyword(s):  
Soft Errors

Soft Errors Induced by Energetic Protons

1979 ◽  
Vol 26 (6) ◽  
pp. 4905-4910 ◽  
Author(s):  
R. C. Wyatt ◽  
P. J. McNulty ◽  
P. Toumbas ◽  
P. L. Rothwell ◽  
R. C. Filz
Keyword(s):  
Soft Errors
Sign in / Sign up

Export Citation Format

Share Document