The Effect of Tunnel Barrier at Resistive Switching Device for Low Power Memory Applications

Author(s):  
Hyejung Choi ◽  
Jaeyun Yi ◽  
Sangmin Hwang ◽  
Sangkeum Lee ◽  
Seokpyo Song ◽  
...  
2009 ◽  
Vol 105 (11) ◽  
pp. 114103 ◽  
Author(s):  
Ch. Walczyk ◽  
Ch. Wenger ◽  
R. Sohal ◽  
M. Lukosius ◽  
A. Fox ◽  
...  

AIP Advances ◽  
2019 ◽  
Vol 9 (10) ◽  
pp. 105030 ◽  
Author(s):  
Chengyue Xiong ◽  
Ziyao Lu ◽  
Siqi Yin ◽  
Hongming Mou ◽  
Xiaozhong Zhang

2011 ◽  
Vol 50 (10S) ◽  
pp. 10PH01 ◽  
Author(s):  
Writam Banerjee ◽  
Sheikh Ziaur Rahaman ◽  
Amit Prakash ◽  
Siddheswar Maikap

2011 ◽  
Vol 50 (10) ◽  
pp. 10PH01 ◽  
Author(s):  
Writam Banerjee ◽  
Sheikh Ziaur Rahaman ◽  
Amit Prakash ◽  
Siddheswar Maikap

RSC Advances ◽  
2020 ◽  
Vol 10 (69) ◽  
pp. 42249-42255
Author(s):  
Xiaohan Wu ◽  
Ruijing Ge ◽  
Yifu Huang ◽  
Deji Akinwande ◽  
Jack C. Lee

Constant voltage and current stress were applied on MoS2 resistive switching devices, showing unique behaviors explained by a modified conductive-bridge-like model.


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