An Efficient Fault Tolerance Scheme for Preventing Single Event Disruptions in Reconfigurable Architectures

2006 ◽  
Author(s):  
S. Baloch ◽  
T. Arslan ◽  
A. Stoica
Keyword(s):  
Fault Tolerance ◽  
Reconfigurable Architectures ◽  
Single Event

scholarly journals A Methodology to Analyze the Fault Tolerance of Demosaicking Methods against Memory Single Event Functional Interrupts (SEFIs)

Electronics ◽  
2020 ◽  
Vol 9 (10) ◽  
pp. 1619
Author(s):  
Luis Alberto Aranda ◽  
Alfonso Sánchez-Macián ◽  
Juan Antonio Maestro
Keyword(s):  
Fault Tolerance ◽  
Fault Tolerant ◽  
Soft Errors ◽  
Normal Operation ◽  
Harsh Environments ◽  
Single Event ◽  
Electronic Circuits ◽  
Memory Chip ◽  
Interpolation Algorithms ◽  
Rgb Images

Electronic circuits in harsh environments, such as space, are affected by soft errors produced by radiation. A single event functional interrupt (SEFI) can affect the behavior of a memory chip, with one or more rows, columns or even the whole device producing a wrong value when reading a set of stored bits. This problem may affect raw Bayer images stored in satellites and other spacecraft. In this paper, we present a methodology to analyze how different interpolation algorithms behave when they try to reconstruct the affected Bayer images into standard red, green and blue (RGB) images. This methodology can be used to compare and develop new fault-tolerant algorithms. The proposed methodology has been illustrated by studying a subset of interpolation algorithms. The results obtained from this example show that the interpolation algorithms that traditionally offer better results in a normal operation (in the absence of errors) are not always the best when SEFI errors are present in the Bayer images.

scholarly journals Studying the Fault Tolerance of SRAM With the Function of Correcting Single Event Upsets Caused by Heavy Ions

2018 ◽  
pp. 327-329
Author(s):  
Krasnikov Gennadiy Ya. ◽  
Lushnikov Alexander S. ◽  
Meschanov Vladimir D. ◽  
Rybalko Egor S. ◽  
Fomicheva Nadezhda N. ◽  
...  
Keyword(s):  
Fault Tolerance ◽  
Heavy Ions ◽  
Single Event ◽  
Single Event Upsets

Aging Resilience and Fault Tolerance in Runtime Reconfigurable Architectures

2017 ◽  
Vol 66 (6) ◽  
pp. 957-970 ◽  
Author(s):  
Hongyan Zhang ◽  
Lars Bauer ◽  
Michael Andreas Kochte ◽  
Eric Schneider ◽  
Hans-Joachim Wunderlich ◽  
...  
Keyword(s):  
Fault Tolerance ◽  
Reconfigurable Architectures

Module diversification: Fault tolerance and aging mitigation for runtime reconfigurable architectures

2013 ◽  
Author(s):  
Hongyan Zhang ◽  
Lars Bauer ◽  
Michael A. Kochte ◽  
Eric Schneider ◽  
Claus Braun ◽  
...  
Keyword(s):  
Fault Tolerance ◽  
Reconfigurable Architectures
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