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2006 ◽  
Author(s):  
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Keyword(s):  
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1986 ◽  
Author(s):  
R. Koga ◽  
W. A. Kolasinski ◽  
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Keyword(s):  
Single Event Upset ◽  
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Single Event Upset Evaluation for a 28-nm FDSOI SRAM Type Buffer in an ARM Processor

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Author(s):  
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Rui Chen ◽  
Rui Liu ◽  
Mo Chen ◽  
Chen Shen ◽  
...  
Keyword(s):  
Single Event Upset ◽  
Single Event ◽  
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2021 ◽  
Vol 120 ◽  
pp. 114128
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Heavy Ion ◽  
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Single Event Upset ◽  
Single Event ◽  
Ion Energy
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