scholarly journals A Seed-Selection Method to Increase Defect Coverage for LFSR-Reseeding-Based Test Compression

2007 ◽  
Author(s):  
Zhanglei Wang ◽  
Krishnendu Chakrabarty ◽  
Michael Bienek
Keyword(s):  
Selection Method ◽  
Defect Coverage ◽  
Seed Selection ◽  
Test Compression ◽  
Lfsr Reseeding

scholarly journals Defect Coverage-Driven Window-Based Test Compression

2010 ◽  
Author(s):  
Xrysovalantis Kavousianos ◽  
Krishnendu Chakrabarty ◽  
Emmanouil Kalligeros ◽  
Vasileios Tenentes
Keyword(s):  
Defect Coverage ◽  
Test Compression

Combining external prior and internal features: toward a robust foreground seed selection method

2019 ◽  
Vol 28 (03) ◽  
pp. 1
Author(s):  
Huibin Wang ◽  
Chao Zhu ◽  
Lizhong Xu ◽  
Zhen Zhang ◽  
Yunbo Xiong
Keyword(s):  
Selection Method ◽  
Seed Selection

LFSR Reseeding-Oriented Low-Power Test-Compression Architecture for Scan Designs

2018 ◽  
Vol 34 (6) ◽  
pp. 685-695 ◽  
Author(s):  
Haiying Yuan ◽  
Changshi Zhou ◽  
Xun Sun ◽  
Kai Zhang ◽  
Tong Zheng ◽  
...  
Keyword(s):  
Low Power ◽  
Power Test ◽  
Test Compression ◽  
Low Power Test ◽  
Lfsr Reseeding
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