Study of discrete voids formation in flip-chip solder joints due to electromigration using in-situ 3D laminography and finite-element modeling
2006 ◽
Vol 35
(8)
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pp. 1647-1654
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Keyword(s):
2003 ◽
Vol 32
(11)
◽
pp. 1322-1329
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Keyword(s):
Keyword(s):
2015 ◽
Vol 40
(1)
◽
pp. 105-116
◽
2015 ◽
Vol 786
◽
pp. 131-135